ASTM-E995 2016
$34.13
E995-16 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
| Published By | Publication Date | Number of Pages |
| ASTM | 2016 | 6 |
ASTM E995-16
Active Standard: Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ASTM E995
Scope
1.1 The purpose of this guide is to familiarize the analyst with the principal background subtraction techniques presently in use together with the nature of their application to data acquisition and manipulation.
1.2 This guide is intended to apply to background subtraction in electron, X-ray, and ion-excited Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS).
1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
Keywords
Auger electron spectroscopy; background subtraction; surface analysis; X-ray photoelectron spectroscopy;
ICS Code
ICS Number Code 17.180.30 (Optical measuring instruments)
DOI: 10.1520/E0995-16
