BS EN 60444-1:1997:2000 Edition
$142.49
Measurement of quartz crystal unit parameters – Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a π-network
| Published By | Publication Date | Number of Pages |
| BSI | 2000 | 32 |
| Status | Definitive |
|---|---|
| Pages | 32 |
| Publication Date | 2000-08-15 |
| ISBN | 0 580 22496 1 |
| Standard Number | BS EN 60444-1:1997, IEC 60444-1:1986 |
| Title | Measurement of quartz crystal unit parameters – Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a π-network |
| Identical National Standard Of | IEC 60444-1:1986/AMD1:1999, EN 60444-1:1997/A1:1999 |
| Descriptors | Electrical resistance, Resonators, Reproducibility, Crystal resonators, Resistance measurement, Electrical measurement, Electrical wave measurement, Piezoelectric devices, Circuit networks, Resonance, Compensators (electric), Circuits, Testing conditions, Resonant frequency, Quartz, Wave properties and phenomena, Calibration, Frequency measurement, Test equipment, Dielectric devices, Accuracy, Frequencies, Phase measurement (electric) |
| Publisher | BSI |
| Committee | W/- |
| Amends | 01-0000000000, BS EN 60444-1:1997, WD/97/202225DC |
| ICS Codes | 31.140 - Piezoelectric devices |
