BS EN 60512-28-100:2013
$167.15
Connectors for electronic equipment. Tests and measurements – Signal integrity tests up to 1000 MHz on IEC 60603-7 and IEC 61076-3 series connectors. Tests 28a to 28g
| Published By | Publication Date | Number of Pages |
| BSI | 2013 | 38 |
This part of IEC 60512 specifies the test methods for transmission performance for IEC 60603-7 and IEC 61076-3 series connectors up to 1 000 MHz. It is also suitable for testing lower frequency connectors, however the test methodology specified in the detailed specification for any given connector remains the reference conformance test for that connector.
The test methods provided here are:
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insertion loss, test 28a;
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return loss, test 28b;
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near-end crosstalk (NEXT) test 28c;
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far-end crosstalk (FEXT), test 28d;
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transverse conversion loss (TCL), test 28f;
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transverse conversion transfer loss (TCTL), test 28g.
For the transfer impedance (ZT) test, see IEC 60512-26-100, test 26e.
For the coupling attenuation, see IEC 62153-4-12.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 7 | English CONTENTS |
| 10 | 1 Scope 2 Normative references |
| 11 | 3 Terms, definitions and acronyms 3.1 Terms and definitions 3.2 Acronyms |
| 12 | 4 Overall test arrangement 4.1 Test instrumentation 4.2 Measurement precautions |
| 13 | 4.3 Mixed mode S-parameter nomenclature Figures Figure 1 – Diagram of a single ended 4 port device Figure 2 – Diagram of a balanced 2 port device |
| 14 | 4.4 Coaxial cables and interconnect for network analysers 4.5 Requirements for switching matrices Tables Table 1 – Mixed mode S-parameter nomenclature |
| 15 | 4.6 Test fixture requirements Figure 3 – Test interface pattern Table 2 – Switch performance recommendations |
| 16 | 4.7 Requirements for termination performance at calibration plane 4.8 Reference loads for calibration Table 3 – Test fixture requirements Table 4 – Requirements for terminations at calibration plane |
| 17 | 4.9 Calibration 4.10 Termination loads for termination of conductor pairs 4.10.1 General Figure 4 – Calibration of reference loads |
| 18 | 4.10.2 Verification of termination loads 4.11 Termination of screens 4.12 Test specimen and reference planes 4.12.1 General Figure 5 – Resistor termination networks |
| 19 | 4.12.2 Interconnections between device under test (DUT) and the calibration plane Figure 6 – Definition of reference planes |
| 21 | 4.13 Overall test setup requirements 5 Connector measurement up to 1 000 MHz 5.1 General Table 5 – Interconnection DM return loss requirements Table 6 – Overall test setup requirements |
| 22 | 5.2 Insertion loss, Test 28a 5.2.1 Object 5.2.2 Connecting hardware insertion loss 5.2.3 Test method 5.2.4 Test set-up 5.2.5 Procedure |
| 23 | 5.2.6 Test report 5.2.7 Accuracy 5.3 Return loss, Test 28b 5.3.1 Object 5.3.2 Connecting hardware return loss 5.3.3 Test method Figure 7 – Insertion loss and TCTL measurement |
| 24 | 5.3.4 Test set-up 5.3.5 Procedure 5.3.6 Test report 5.3.7 Accuracy 5.4 Near-end crosstalk (NEXT), Test 28c 5.4.1 Object 5.4.2 Connecting hardware NEXT 5.4.3 Test method |
| 25 | 5.4.4 Test set-up 5.4.5 Procedure Figure 8 – NEXT measurement |
| 26 | 5.4.6 Test report 5.4.7 Accuracy 5.5 Far-end crosstalk (FEXT), Test 28d 5.5.1 Object 5.5.2 Connecting hardware FEXT 5.5.3 Test method 5.5.4 Test set-up |
| 27 | 5.5.5 Procedure 5.5.6 Test report 5.5.7 Accuracy Figure 9 – FEXT measurement |
| 28 | 5.6 Transfer impedance (ZT), Test 28e 5.7 Transverse conversion loss (TCL), Test 28f 5.7.1 Object 5.7.2 Connecting hardware TCL 5.7.3 Test method 5.7.4 Test set-up 5.7.5 Procedure Figure 10 – Return loss and TCL measurement |
| 29 | 5.7.6 Test report 5.7.7 Accuracy 5.8 Transverse conversion transfer loss (TCTL), Test 28g 5.8.1 Object 5.8.2 Connecting hardware TCTL |
| 30 | 5.8.3 Test method 5.8.4 Test set-up 5.8.5 Procedure 5.8.6 Test report 5.8.7 Accuracy |
| 31 | 5.9 Coupling attenuation |
| 32 | Annex A (informative) Example derivation of mixed mode parameters using the modal decomposition technique Figure A.1 – Voltage and current on balanced DUT |
| 33 | Figure A.2 – Voltage and current on unbalanced DUT |
| 35 | Annex B (informative) Test pins – Dimensions and references Figure B.1 – Example of pin and fixed connector dimensions |
| 36 | Bibliography |
