BS EN 62132-8:2012
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Integrated circuits. Measurement of electromagnetic immunity – Measurement of radiated immunity. IC stripline method
| Published By | Publication Date | Number of Pages |
| BSI | 2012 | 26 |
IEC 62132-8:2012 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz. This publication is to be read in conjunction with /2.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 6 | English CONTENTS |
| 8 | 1 Scope 2 Normative references 3 Terms and definitions |
| 9 | 4 General 5 Test conditions 5.1 General |
| 10 | 5.2 Supply voltage 5.3 Frequency range 6 Test equipment 6.1 General 6.2 Cables 6.3 Shielding 6.4 RF disturbance generator 6.5 IC stripline 6.6 50 Ω termination 6.7 DUT monitor |
| 11 | 7 Test setup 7.1 General 7.2 Test configuration 7.3 EMC test board (PCB) 8 Test procedure 8.1 General Figures Figure 1 – IC stripline test setup |
| 12 | 8.2 Operational check 8.3 Immunity measurement 8.3.1 General 8.3.2 RF disturbance signal 8.3.3 Test frequency steps and ranges 8.3.4 Test levels and dwell time 8.3.5 DUT monitoring Tables Table 1 – Frequency step size versus frequency range |
| 13 | 8.3.6 Detail procedure 9 Test report 10 RF immunity acceptance level |
| 14 | Annex A (normative) Field strength determination Figure A.1 – Definition of height (h) and width (w) of IC stripline |
| 15 | Figure A.2 – EM field distribution |
| 17 | Annex B (normative) IC stripline descriptions Figure B.1 – Cross section view of an example of an open IC stripline |
| 18 | Figure B.2 – Cross section view of an example of a closed IC stripline Table B.1 – Maximum DUT dimensions for 6,7 mm IC stripline (Open version) Table B.2 – Maximum DUT dimensions for 6,7 mm IC stripline (Closed version) |
| 19 | Figure B.3 – Example of IC stripline with housing |
| 20 | Annex C (informative) Closed stripline geometrical limitations |
| 21 | Table C.1 – Height of shielding, simulated at hbottom = 6,7mm to achieve practically 50 Ω system |
| 22 | Figure C.1 – Calculated H-field reduction of closed version referencedto referring open version as a function of portion of active conductorwidth of closed version to open version |
| 23 | Figure C.2 – Location of currents and mirrored currents at grounded planes used for calculation of fields |
| 24 | Bibliography |
