BS EN 62374:2007 2008

$142.49

Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films

Published By	Publication Date	Number of Pages
BSI	2008	24

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Categories: 31.080.99 - Other semiconductor devices, BSI

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Description

Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure

Additional information

Status	Under Review
Pages	24
Publication Date	2008-10-31
ISBN	978 0 580 54048 6
Standard Number	BS EN 62374:2007
Title	Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Identical National Standard Of	IEC 62374:2007, EN 62374:2007
Descriptors	Mathematical calculations, Electrical measurement, Semiconductor devices, Testing conditions, Semiconductors, Films (states of matter), Dielectric breakdown, Life (durability)
Publisher	BSI
Committee	EPL/47
ICS Codes	31.080.99 - Other semiconductor devices

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BS EN 62374:2007 2008

$142.49


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