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BS EN 62386-103:2014:2015 Edition

BS EN 62386-103:2014:2015 Edition

$256.21

Digital addressable lighting interface – General requirements. Control devices

Published By Publication Date Number of Pages
BSI 2015 220
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IEC 62386-103:2014 is applicable to control devices in a bus system for control by digital signals of electronic lighting equipment. This electronic lighting equipment should be in line with the requirments of IEC 61347, with the addition of d.c. supplies. This publication is to be read in conjunction with /2

PDF Catalog

PDF Pages PDF Title
6 English
CONTENTS
15 INTRODUCTION
Figures
Figure 1 – IEC 62386 graphical overview
17 1 Scope
2 Normative references
3 Terms and definitions
20 4 General
4.1 General
4.2 Version number
5 Electrical specification
6 Interface power supply
7 Transmission protocol structure
7.1 General
21 7.2 24 bit forward frame encoding
7.2.1 Frame format for instructions and queries
Tables
Table 1 – 24bit command frame encoding
Table 2 – Instance byte in a command frame
22 7.2.2 Frame format for event messages
Table 3 – 24bit event message frame encoding
23 8 Timing
9 Method of operation
9.1 General
9.2 Application controller
9.2.1 General
24 9.2.2 Single-master application controller
9.2.3 Multi-master application controller
9.3 Input device
25 9.4 Instances of input devices
9.4.1 General
9.4.2 Instance number
9.4.3 Instance type
9.4.4 Feature type
Table 4 – Instance types
Table 5 – Feature types
26 9.4.5 Instance groups
9.5 Commands
9.5.1 General
9.5.2 Device commands
Table 6 – Instance group variables
27 9.5.3 Instance commands
9.5.4 Feature commands
9.6 Event messages
9.6.1 Response to event messages
9.6.2 Device power cycle event
9.6.3 Input notification event
Table 7 – Device address information in power cycle event
28 9.6.4 Event message filter
Table 8 – Event addressing schemes
29 9.7 Input signal and input value
9.7.1 General
9.7.2 Input resolution
9.7.3 Getting the input value
Table 9 – Signal level (~50%) versus resolution and input value
30 9.7.4 Notification of changes
9.8 System failure
Table 10 – Example querying sequence to read a 4byte input value
31 9.9 Operating a control device
9.9.1 Enable/disable the application controller
9.9.2 Enable/disable event messages
9.9.3 Quiescent mode
32 9.9.4 Modes of operation
9.10 Memory banks
9.10.1 General
33 9.10.2 Memory map
9.10.3 Selecting a memory bank location
Table 11 – Basic memory map of memory banks
34 9.10.4 Memory bank reading
9.10.5 Memory bank writing
35 9.10.6 Memory bank 0
36 Table 12 – Memory map of memory bank 0
37 9.10.7 Memory bank 1
38 Table 13 – Memory map of memory bank 1
39 9.10.8 Manufacturer specific memory banks
9.10.9 Reserved memory banks
9.11 Reset
9.11.1 Reset operation
9.11.2 Reset memory bank operation
9.12 Power on behaviour
9.12.1 Power on
40 9.12.2 Power cycle notification
9.13 Priority use
9.13.1 General
9.13.2 Priority of input notifications
41 9.14 Assigning short addresses
9.14.1 General
9.14.2 Random address allocation
9.14.3 Identification of a device
42 9.15 Exception handling
9.16 Device capabilities and status information
9.16.1 Device capabilities
9.16.2 Device status
Table 14 – Control device capabilities
Table 15 – Control device status
43 9.16.3 Instance status
9.17 Non-volatile memory
Table 16 – Instance status
44 10 Declaration of variables
Table 17 – Declaration of device variables
45 11 Definition of commands
11.1 General
11.2 Overview sheets
Table 18 – Declaration of instance variables
Table 19 – Instance event messages
Table 20 – Device event messages
46 Table 21 – Standard commands
49 Table 22 – Special commands (implemented by both application controller and input device)
50 11.3 Event messages
11.3.1 INPUT NOTIFICATION (device/instance, event)
11.3.2 POWER NOTIFICATION (device)
11.4 Device control instructions
11.4.1 General
11.4.2 IDENTIFY DEVICE
51 11.4.3 RESET POWER CYCLE SEEN
11.5 Device configuration instructions
11.5.1 General
11.5.2 RESET
11.5.3 RESET MEMORY BANK (DTR0)
11.5.4 SET SHORT ADDRESS (DTR0)
11.5.5 ENABLE WRITE MEMORY
52 11.5.6 ENABLE APPLICATION CONTROLLER
11.5.7 DISABLE APPLICATION CONTROLLER
11.5.8 SET OPERATING MODE (DTR0)
11.5.9 ADD TO DEVICE GROUPS 0-15 (DTR2:DTR1)
11.5.10 ADD TO DEVICE GROUPS 16-31 ( DTR2:DTR1 )
11.5.11 REMOVE FROM DEVICE GROUPS 0-15 (DTR2:DTR1)
11.5.12 REMOVE FROM DEVICE GROUPS 16-31 (DTR2:DTR1)
11.5.13 START QUIESCENT MODE
11.5.14 STOP QUIESCENT MODE
53 11.5.15 ENABLE POWER CYCLE NOTIFICATION
11.5.16 DISABLE POWER CYCLE NOTIFICATION
11.5.17 SAVE PERSISTENT VARIABLES
11.6 Device queries
11.6.1 General
11.6.2 QUERY DEVICE CAPABILITIES
11.6.3 QUERY DEVICE STATUS
54 11.6.4 QUERY APPLICATION CONTROLLER ERROR
11.6.5 QUERY INPUT DEVICE ERROR
11.6.6 QUERY MISSING SHORT ADDRESS
11.6.7 QUERY VERSION NUMBER
11.6.8 QUERY CONTENT DTR0
11.6.9 QUERY NUMBER OF INSTANCES
11.6.10 QUERY CONTENT DTR1
11.6.11 QUERY CONTENT DTR2
55 11.6.12 QUERY RANDOM ADDRESS (H)
11.6.13 QUERY RANDOM ADDRESS (M)
11.6.14 QUERY RANDOM ADDRESS (L)
11.6.15 READ MEMORY LOCATION (DTR1, DTR0)
11.6.16 QUERY APPLICATION CONTROL ENABLED
11.6.17 QUERY OPERATING MODE
11.6.18 QUERY MANUFACTURER SPECIFIC MODE
11.6.19 QUERY QUIESCENT MODE
11.6.20 QUERY DEVICE GROUPS 0-7
56 11.6.21 QUERY DEVICE GROUPS 8-15
11.6.22 QUERY DEVICE GROUPS 16-23
11.6.23 QUERY DEVICE GROUPS 24-31
11.6.24 QUERY POWER CYCLE NOTIFICATION
11.6.25 QUERY EXTENDED VERSION NUMBER(DTR0)
11.6.26 QUERY RESET STATE
11.7 Instance control instructions
11.8 Instance configuration instructions
11.8.1 General
57 11.8.2 ENABLE INSTANCE
11.8.3 DISABLE INSTANCE
11.8.4 SET PRIMARY INSTANCE GROUP (DTR0)
11.8.5 SET INSTANCE GROUP 1 (DTR0)
11.8.6 SET INSTANCE GROUP 2 (DTR0)
11.8.7 SET EVENT SCHEME (DTR0)
58 11.8.8 SET EVENT PRIORITY (DTR0)
11.8.9 SET EVENT FILTER (DTR2, DTR1, DTR0)
11.9 Instance queries
11.9.1 General
11.9.2 QUERY INSTANCE TYPE
11.9.3 QUERY RESOLUTION
11.9.4 QUERY INSTANCE ERROR
11.9.5 QUERY INSTANCE STATUS
59 11.9.6 QUERY INSTANCE ENABLED
11.9.7 QUERY PRIMARY INSTANCE GROUP
11.9.8 QUERY INSTANCE GROUP 1
11.9.9 QUERY INSTANCE GROUP 2
11.9.10 QUERY EVENT SCHEME
11.9.11 QUERY INPUT VALUE
11.9.12 QUERY INPUT VALUE LATCH
11.9.13 QUERY EVENT PRIORITY
60 11.9.14 QUERY FEATURE TYPE
11.9.15 QUERY NEXT FEATURE TYPE
11.9.16 QUERY EVENT FILTER 0-7
11.9.17 QUERY EVENT FILTER 8-15
11.9.18 QUERY EVENT FILTER 16-23
11.10 Special commands
11.10.1 General
11.10.2 TERMINATE
61 11.10.3 INITIALISE (device)
11.10.4 RANDOMISE
11.10.5 COMPARE
11.10.6 WITHDRAW
Table 23 – Device addressing with “INITIALISE (device)”
62 11.10.7 SEARCHADDRH (data)
11.10.8 SEARCHADDRM (data)
11.10.9 SEARCHADDRL (data)
11.10.10 PROGRAM SHORT ADDRESS (data)
11.10.11 VERIFY SHORT ADDRESS (data)
63 11.10.12 QUERY SHORT ADDRESS
11.10.13 WRITE MEMORY LOCATION (DTR1, DTR0, data)
11.10.14 WRITE MEMORY LOCATION – NO REPLY (DTR1, DTR0, data)
11.10.15 DTR0 (data)
64 11.10.16 DTR1 (data)
11.10.17 DTR2 (data)
11.10.18 DIRECT WRITE MEMORY (DTR1, offset, data)
11.10.19 DTR1:DTR0 (data1, data0)
11.10.20 DTR2:DTR1 (data2, data1)
11.10.21 SEND TESTFRAME (data)
65 12 Test procedures
12.1 General notes on test
12.1.1 General
12.1.2 Test execution
66 12.1.3 Data transmission
12.1.4 Test setup
12.1.5 Test output
67 12.1.6 Test notation
68 12.1.7 Test execution limitations
12.1.8 Test results
12.1.9 Exception handling
12.1.10 Unexpected answer
69 Table 24 – Unexpected outcome
70 12.2 Preamble
12.2.1 Test preamble
76 Table 25 – Parameters for test sequence Check Factory Default 103
79 Table 26 – Parameters for test sequence CheckFactoryDefault103PerLogicalUnit
81 12.3 Physical operational parameters
12.3.1 Polarity test
Table 27 – Parameters for test sequence Transmitter bit timing
82 12.3.2 Maximum and minimum system voltage
12.3.3 Overvoltage protection test
Table 28 – Parameters for test sequence Maximum and minimum system voltage
83 12.3.4 Current rating test
84 Figure 2 – Current rating test
85 12.3.5 Transmitter voltages
86 12.3.6 Transmitter rising and falling edges
Table 29 – Parameters for test sequence Transmitter voltages
87 Table 30 – Parameters for test sequence Transmitter rising and falling edges
88 12.3.7 Transmitter bit timing
90 12.3.8 Transmitter frame timing
Table 31 – Parameters for test sequence Transmitter bit timing
91 12.3.9 Receiver start-up behavior
Table 32 – Parameters for test sequence Receiver frame timing
92 12.3.10 Receiver threshold
Table 33 – Parameters for test sequence Receiver start-up behavior
93 12.3.11 Receiver bit timing
94 Table 34 – Parameters for test sequence Receiver bit timing
97 12.3.12 Extended receiver bit timing
98 Table 35 – Parameters for test sequence extended receiver bit timing
99 12.3.13 Receiver forward frame violation
12.3.14 Receiver settling timing
Table 36 – Parameters for test sequence Receiver frame violationand recovering after frame size violation
100 12.3.15 Receiver frame timing FF-FF send twice
Table 37 – Parameters for test sequence Receiver frame timing
102 12.3.16 Transmitter collision avoidance by priority
103 12.3.17 Transmitter collision detection for truncated idle phase
Table 38 – Parameters for test sequence transmitter collision avoidance by priority
106 12.3.18 Transmitter collision detection for extended active phase
Table 39 – Parameters for test sequence transmittercollision detection for truncated idle phase
109 12.4 Device configuration instructions
12.4.1 RESET deviceGroups
Table 40 – Parameters for test sequence transmittercollision detection for extended active phase
110 12.4.2 RESET quiescentMode
111 12.4.3 RESET instance groups
112 12.4.4 RESET event filter
Table 41 – Parameters for test sequence RESET instance groups
113 12.4.5 RESET event scheme
114 12.4.6 RESET: timeout / command in-between
116 12.4.7 Send twice timeout (device)
118 Table 42 – Parameters for test sequence Send twice timeout (device)
119 12.4.8 Send twice timeout (instance)
120 Table 43 – Parameters for test sequence Send twice timeout (instance)
121 12.4.9 Commands in-between (device)
123 Table 44 – Parameters for test sequence Commands in-between (device)
124 12.4.10 Commands in-between (instance)
126 Table 45 – Parameters for test sequence Commands in-between
127 12.4.11 SAVE PERSISTENT VARIABLES
12.4.12 SET OPERATING MODE
128 12.4.13 Device Disable/Enable Application Controller
129 12.4.14 Multi Master Control Device PING
130 12.4.15 Quiescent Mode
131 12.4.16 Device power cycle notification
132 12.4.17 SET SHORT ADDRESS
133 12.4.18 Reset/Power-on values (device)
Table 46 – Parameters for test sequence SET SHORT ADDRESS
134 Table 47 – Parameters for test sequence Reset/Power-on values (device)
135 12.4.19 Reset/Power-on values (instance)
136 12.4.20 DTR0 / DTR1 / DTR2
Table 48 – Parameters for test sequence Reset/Power-on values (instance)
Table 49 – Parameters for test sequence DTR0 / DTR1 / DTR2
137 12.4.21 DTR1:DTR0 and DTR2:DTR1
138 12.4.22 Device Groups
Table 50 – Parameters for test sequence DTR1:DTR0 and DTR2:DTR1
139 12.5 Device queries
12.5.1 Device query capabilities
12.5.2 QUERY VERSION NUMBER
140 12.5.3 Device power cycle seen
12.5.4 Input device error
141 12.6 Device Memory banks
12.6.1 READ MEMORY LOCATION on Memory Bank 0
145 Table 51 – Parameters for test sequence READ MEMORY LOCATION on Memory Bank 0
146 12.6.2 READ MEMORY LOCATION on Memory Bank 1
148 12.6.3 READ MEMORY LOCATION on other Memory Banks
Table 52 – Parameters for test sequence READ MEMORY LOCATION on Memory Bank 1
150 12.6.4 Memory bank writing
153 Table 53 – Parameters for test sequence Memory bank writing
155 12.6.5 ENABLE WRITE MEMORY: writeEnableState
156 Table 54 – Parameters for test sequence ENABLE WRITE MEMORY: writeEnableState
157 12.6.6 ENABLE WRITE MEMORY: timeout / command in-between
158 12.6.7 RESET MEMORY BANK: timeout / command in-between
Table 55 – Parameters for test sequence ENABLE WRITE MEMORY: timeout / command in-between
161 12.6.8 RESET MEMORY BANK
Table 56 – Parameters for test sequence RESET MEMORY BANK:timeout / command in-between
162 12.7 Device Special commands
12.7.1 INITIALISE – timer
Table 57 – Parameters for test sequence RESET MEMORY BANK
163 12.7.2 TERMINATE
164 12.7.3 INITIALISE – device addressing
Table 58 – Parameters for test sequence INITIALISE – device addressing
165 12.7.4 RANDOMISE
12.7.5 COMPARE
166 Table 59 – Parameters for test sequence COMPARE
167 12.7.6 WITHDRAW
168 12.7.7 SEARCHADDRH / SEARCHADDRM / SEARCHADDRL
Table 60 – Parameters for test sequence WITHDRAW
169 12.7.8 PROGRAM SHORT ADDRESS
170 Table 61 – Parameters for test sequence PROGRAM SHORT ADDRESS
171 12.7.9 VERIFY SHORT ADDRESS
172 12.7.10 QUERY SHORT ADDRESS
Table 62 – Parameters for test sequence VERIFY SHORT ADDRESS
173 Table 63 – Parameters for test sequence QUERY SHORT ADDRESS
174 12.7.11 IDENTIFY DEVICE
175 Table 64 – Parameters for test sequence IDENTIFY DEVICE
176 12.8 Logical unit cross contamination
12.8.1 DTR0
12.8.2 NVM variables
177 12.8.3 Random address generation
178 12.8.4 Addressing 1
179 12.8.5 Addressing 2
181 12.8.6 Addressing 3
Table 65 – Parameters for test sequence Addressing 2
182 12.9 Instance addressing
12.9.1 Instance Type Addressing
183 12.9.2 Instance Primary Group
184 12.9.3 Instance Group 2
186 12.9.4 Instance Group 1
187 12.9.5 Instance Group Combinations
189 12.9.6 Multiple Instances Answer
190 12.10 Instance configuration instructions
12.10.1 Instance Enable/Disable
192 12.10.2 Event Scheme
197 12.10.3 Input Resolution & Input Value
12.10.4 Event Filter
198 12.11 Instance queries
12.11.1 Instance Number and Types
199 12.11.2 Instance Status
12.11.3 Instance Error
200 12.12 Instance cross contamination
12.12.1 Instance Event Priority
201 12.13 Reserved Commands
12.13.1 Reserved standard device commands
Table 66 – Parameters for test sequence Reserved commands:standard device commands
202 12.13.2 Reserved instance commands (instance type 0)
12.13.3 Reserved special commands
Table 67 – Parameters for test sequence Reserved instance commands (instance type 0)
203 12.14 General subsequences
12.14.1 Reset Device
Table 68 – Parameters for test sequence Reserved special commands
204 12.14.2 EnableApplicationControllerAndAllInstances
12.14.3 DisableApplicationControllerAndAllInstances
12.14.4 HasApplicationController
205 12.14.5 GetVersionNumber
12.14.6 AddDeviceGroups
12.14.7 RemoveDeviceGroups
206 12.14.8 ClearAllDeviceGroups
12.14.9 CheckDeviceGroups
207 12.14.10 GetDeviceGroups
12.14.11 PowerCycle
12.14.12 PowerCycleAndWaitForBusPower
208 12.14.13 PowerCycleAndWaitForDecoder
12.14.14 SetupTestFrame
209 12.14.15 GetNumberOfInstances
12.14.16 GetEventFilter
12.14.17 SetEventFilter
12.14.18 GetNumberOfLogicalUnits
12.14.19 GetIndexOfLogicalUnit
210 12.14.20 GetRandomAddress
12.14.21 GetLimitedRandomAddress
12.14.22 SetSearchAddress
211 12.14.23 SetShortAddress
12.14.24 ReadMemBankMultibyteLocation
212 12.14.25 FindImplementedMemoryBank
12.14.26 FindAllImplementedMemoryBanks
213 12.14.27 ShortAddress
12.14.28 GroupAddress
12.14.29 Broadcast
12.14.30 BroadcastUnaddressed
12.14.31 InstanceNumber
214 12.14.32 InstanceGroup
12.14.33 InstanceType
12.14.34 InstanceBroadcast
12.14.35 FeatureOfInstanceNumber
215 12.14.36 FeatureOfInstanceGroup
12.14.37 FeatureOfInstanceType
12.14.38 FeatureOfInstanceBroadcast
12.14.39 FeatureOfDevice
216 12.14.40 FeatureOfDeviceWithGroupAddress
12.14.41 FeatureOfDeviceWithBroadcast
217 Bibliography

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BS EN 62386-103:2014
$256.21