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BS EN 62493:2015 – TC:2020 Edition

BS EN 62493:2015 – TC:2020 Edition

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Tracked Changes. Assessment of lighting equipment related to human exposure to electromagnetic field

Published By Publication Date Number of Pages
BSI 2020 153
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IEC 62493:2015 applies to the assessment of lighting equipment related to human exposure to electromagnetic fields. The assessment consists of the induced internal electric field for frequencies from 20 kHz to 10 MHz and the specific absorption rate (SAR) for frequencies from 100 kHz to 300 MHz around lighting equipment. This second edition cancels and replaces the first edition published in 2009. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) identification of lighting product types deemed to comply with the standard without the need for test; b) deletion of the need for CISPR-15-compliance as a prerequisite for IEC 62493 compliance; c) inclusion of the consequences of the ICNIPR 2010 guidelines for (up to 100 kHz); d) adding some guidance to the Van der Hoofden test head method to improve reproducibility of results; e) inclusion of compliance demonstration method for products having intentional radiators.

PDF Catalog

PDF Pages PDF Title
89 English
CONTENTS
93 FOREWORD
95 INTRODUCTION
96 1 Scope
2 Normative references
97 3 Terms, definitions, physical quantities, units and abbreviations
3.1 Terms and definitions
99 3.2 Physical quantities and units
100 3.3 Abbreviations
4 Limits
4.1 General
Tables
Table 1 – Physical quantities and units
101 4.2 Unintentional radiating part of lighting equipment
4.2.1 General
4.2.2 Lighting equipment deemed to comply with the Van der Hoofden test without testing
4.2.3 Application of limits
4.3 Intentional radiating part of lighting equipment
102 5 General requirements Van der Hoofden test
5.1 Measurand
5.2 Supply voltage and frequency
Figures
Figure 1 – Compliance routes and pass/fail criteria for lighting equipment
103 5.3 Measurement frequency range
5.4 Ambient temperature
5.5 Measurement equipment requirements
Figure 2 – The Van der Hoofden test head
Table 2 – Receiver or spectrum analyser settings
104 5.6 Measurement instrumentation uncertainty
5.7 Test report
Figure 3 – Example of a protection circuit
105 5.8 Evaluation of results
6 Measurement procedure for the Van der Hoofden test
6.1 General
6.2 Operating conditions
6.2.1 Operating conditions for lighting equipment
6.2.2 Operating conditions for specific lighting equipment
106 6.2.3 Operating conditions for lighting equipment with intentional radiators
6.3 Measurement distance
6.4 Measurement set-up
6.4.1 General
Figure 4 – Measurement set-up
107 6.4.2 Measurement set-up for specific lighting equipment
6.5 Location of measurement test head
6.6 Calculation of the results
7 Assessment procedure intentional radiators
7.1 General
7.2 Low-power exclusion method
7.2.1 General
108 7.2.2 Determination of the total radiated power
7.2.3 Determination of the low-power exclusion level
7.2.4 Summation of multiple transmitters
7.3 Application of the EMF product standard for body worn-equipment
7.4 Application of the EMF product standard for base stations
7.5 Application of another EMF standard
109 Figure 5 – Compliance demonstration procedure for the intentional-transmitter part of the lighting equipment
110 Annexes
Annex A (normative) Measurement distances
111 Annex B (informative) Location of measurement test head
Figure B.1 – Location of measurement point in the transverse direction of lighting equipment – side view
Figure B.2 – Location of measurement points in the longitude direction of lighting equipment – side view
112 Figure B.3 – Location of measurement points in the longitude direction of lighting equipment; in the direction of illumination
Figure B.4 – Location of measurement point for lighting equipment with rotationally symmetrical dimensions
113 Figure B.5 – Location of measurement point for lighting equipment with rotationally symmetrical dimensions; in the direction of illumination
Figure B.6 – Location of measurement point for lighting equipment with the same dimensions in the x- and y- axis
Table A.1 – Lighting equipment and measurement distances
114 Figure B.7 – Location of measurement point(s) for lighting equipment with single capped lamp (360° illumination)
Figure B.8 – Location of measurement points for lighting equipment with a remote controlgear
115 Figure B.9 – Location of measurement point for an independent electronic converter
Figure B.10 – Location of measurement point(s) for an uplighter (floor standing/suspended)
116 Annex C (informative) Exposure limits
C.1 General
C.2 ICNIRP
C.2.1 ICNIRP 1998
C.2.2 ICNIRP 2010
C.3 IEEE
Table C.1 – Basic restrictions for general public exposure to time varying electric and magnetic fields for frequencies between 100 kHz and 10 GHz
Table C.2 – Basic restrictions for general public exposure to time varying electric and magnetic fields for frequencies up to 10 MHz
117 Table C.3 – IEEE basic restrictions (BR) for the general public
Table C.4 – IEEE basic restrictions (BR) between 100 kHz and 3 GHz for the general public
118 Annex D (informative) Rationale measurement and assessment method
D.1 General
D.2 Induced internal electric field
D.2.1 General
Figure D.1 – Overview measurement and assessment method
120 D.2.2 Induced electric field due to the magnetic field; Eeddy(fi,dloop)
Figure D.2 – Distances of the head, loop and measurement set-up
121 Table D.1 – Induced internal electric field calculations
122 Figure D.3 – Maximum current in the 2 m LLA as function of the frequency
124 Figure D.4 – Induced internal electric field and associated limit levels
125 D.2.3 Induced electric field due to the electric field; Ecap(fi,d)
Figure D.5 – Example of magnetic-field test result using the LLA
126 Figure D.6 – Distances of the head and measurement set-up
Figure D.7 – Plot of Equation (D.20)
127 Table D.2 – Calculation main contributions
128 D.3 Thermal effects from 100 kHz to 300 GHz
D.3.1 General
Table D.3 – Frequency steps for the amplitude addition that equals 1,11 times B6
129 D.3.2 The 100 kHz to 30 MHz contribution to the thermal effects
Table D.4 – Frequency steps for the power addition that equals 0,833 times B6
130 D.3.3 The 30 MHz to 300 MHz contribution to the thermal effects
Figure D.8 – Example of the CM-current measured using a conducted emission test
Table D.5 – Field strength limits according to CISPR 15
131 D.3.4 Overall conclusion for the contribution to thermal effects
132 Annex E (normative) Practical internal electric-field measurement and assessment method
E.1 Measurement of induced internal electric field
E.2 Calculation program
133 E.3 Compliance criterion for the Van der Hoofden head test
Table E.1 – Conductivity as a function of frequency (see Table C.1 of IEC 62311:2007)
134 Annex F (normative) Protection network
F.1 Calibration of the protection network
Figure F.1 – Test set-up for normalization of the network analyser
135 F.2 Calculation of the theoretical characteristic of the protection network
Figure F.2 – Test set-up for measurement of the voltage division factor using a network analyser
136 Figure F.3 – Calculated theoretical characteristic for the calibration of the protection network
137 Annex G (informative) Measurement instrumentation uncertainty
Table G.1 – Uncertainty calculation for the measurement method described in Clauses 5 and 6 in the frequency range from 20 kHz to 10 MHz
138 Table G.2 – Comments and information to Table G.1
139 Annex H (informative) Equipment deemed to comply
140 Figure H.1 – Flow chart to determine applicability deemed to comply without F factor measurement
141 Annex I (informative) Intentional radiators
I.1 General
I.2 Intentional radiators in lighting equipment
I.3 Properties of antennas in lighting applications
142 Table I.1 – Overview of wireless radio technologies that might be applied in lighting systems
143 Figure I.1 – Luminaire with a transmitting antenna in a room
144 Figure I.2 – Impact of a conducting ceiling/plane
145 Figure I.3 – Electric field of a small electrical dipole: analytical formula vs far-field approximation
146 Figure I.4 – Electric field as a function of distance, antenna gain and input power (far-field approximation)
147 I.4 Exposure assessment approach
I.4.1 General
I.4.2 Determination of average total radiated power Pint,rad
Figure I.5 – Impact of pulsed signals on the average exposure
148 I.4.3 Determination of the low-power exclusion level Pmax
I.5 Multiple transmitters in a luminaire
149 I.6 Exposure to multiple luminaires
I.7 References in Annex I
151 Bibliography

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BS EN 62493:2015 - TC
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