BS EN 62496-2-2:2011
$142.49
Optical circuit boards – Measurements. Dimensions of optical circuit boards
Published By | Publication Date | Number of Pages |
BSI | 2011 | 32 |
IEC 62496-2-2:2011 specifies the measurement procedures for dimensions related to interface information of optical circuit boards (OCB), defined in IEC 62496-4.
PDF Catalog
PDF Pages | PDF Title |
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6 | English CONTENTS |
8 | 1 Scope 2 Normative references 3 Terms and definitions |
9 | 4 Measurement condition 5 Objects to be measured and their procedures 6 Measurement procedures for dimensions 6.1 Core shape Table 1 – Objects to be measured and their methods |
10 | Figures Figure 1 – Example of measuring equipment capable of observing core shape Figure 2 – Example of sample set-up for observation of core shape (end face I/O type OCB or a sliced sample) |
11 | 6.2 Coordinates of I/O ports Figure 3 – Example of sample set-up using a halogen lamp house with light-guide fibre for observation of core shape (surface I/O type OCB) |
12 | Figure 4 – Example of optical position adjustment system for end face I/O type OCB |
16 | 6.3 Outer shape of optical circuit board |
18 | 6.4 Misalignment angle of I/O ports Figure 6 – Example of verification with a dimensional drawing for a fibre flexible OCB |
19 | Figure 7 – Misalignment angle of I/O ports in end face I/O type OCB Figure 8 – Misalignment angle of I/O ports in surface I/O type OCB |
20 | Figure 9 – Parameters for misalignment angle in end face I/O type OCB Figure 10 – Parameters for misalignment angle in surface I/O type OCB |
21 | 6.5 Mirror angle |
23 | 6.6 Hole Figure 11 – Schematic diagram of the mirror angle measurement usinga confocal microscope Figure 12 – Example of the profile at a mirror portion using a confocal microscope |
26 | Annex A (informative) Pattern pitch Figure A.1 – Pattern pitch and objects of measurement (an example of single layer) |
27 | Figure A.2 – Pattern pitch and objects of measurement (an example of multi-layer) |
29 | Bibliography |