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BS EN ISO 18452:2016

$102.76

Fine ceramics (advanced ceramics, advanced technical ceramics). Determination of thickness of ceramic films by contact-probe profilometer

Published By Publication Date Number of Pages
BSI 2016 18
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This International Standard specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

NOTE The method requires a distinct and clearly formed boundary between coated and uncoated parts of the substrate.

BS EN ISO 18452:2016
$102.76