BS EN ISO 18452:2016
$102.76
Fine ceramics (advanced ceramics, advanced technical ceramics). Determination of thickness of ceramic films by contact-probe profilometer
Published By | Publication Date | Number of Pages |
BSI | 2016 | 18 |
This International Standard specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.
NOTE The method requires a distinct and clearly formed boundary between coated and uncoated parts of the substrate.