BS EN ISO 22232-1:2020 – TC
$246.62
Tracked Changes. Non-destructive testing. Characterization and verification of ultrasonic test equipment – Instruments
Published By | Publication Date | Number of Pages |
BSI | 2020 | 122 |
This document specifies methods and acceptance criteria within the frequency range of 0,5 MHz to 15 MHz, for assessing the electrical performance of digital ultrasonic instruments for pulse operation using A-scan display, for manual ultrasonic non-destructive testing with single- or dual-transducer probes. This document is also applicable for multi-channel instruments. This document can partly be applicable to ultrasonic instruments in automated systems, but other tests can be needed to ensure satisfactory performance.
This document excludes ultrasonic instruments for continuous waves.
This document also excludes ultrasonic phased array instruments, see e.g. ISO 18563-1. If a phased array instrument has dedicated connectors for single- or dual-transducer probes this document is applicable for these channels.
PDF Catalog
PDF Pages | PDF Title |
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3 | National foreword Compliance with a British Standard cannot confer immunity from legal obligations. |
5 | ForewordEuropean foreword Endorsement notice |
8 | Foreword |
9 | Non-destructive testing — Characterization and Instruments 1 Scope 2 Normative references 3 Terms and definitions |
10 | 3.1 3.2 3.4 calibrated dB-switch 3.53.3 3.4 3.63.5 3.7 dynamic range 3.83.6 |
11 | 3.93.7 3.103.8 time it takes the proportional gate output to fall from 90 % to 10 % of its peak value 3.11 3.123.9 3.133.10 time for which the proportionalanalogue output (3.1) is above 90 50 % of its peakmaximum output following a signal in the monitor gate 3.143.11 3.15 3.16 3.173.12 3.18 3.19 3.20 |
12 | 3.22 pulse duration 3.23 pulse repetition frequency 3.24 pulse rise time 3.25 pulse reverberation 3.263.13 3.273.14 3.28 rise time of proportional output 3.293.15 3.30 time-dependent gain TDG 3.31 short pulse 3.32 suppression 3.333.16 |
13 | 4 Symbols Table 1 — Symbols |
14 | 6 Manufacturer’s technical specification for ultrasonic instruments |
19 | 7 Performance requirements for ultrasonic instruments |
23 | 8 Group 1 tests 8.1 Equipment required for group 1 tests |
24 | 8.2 Stability against temperature 8.2 Battery operational time 8.2.1 Procedure |
25 | Figure 1 — Set up for measuring stability against temperature |
26 | 8.2.2 Acceptance criterion 8.3 Stability after warm‑up time 8.3.1 Procedure 8.3.2 Acceptance criteria 8.4 Stability against temperature 8.4.1 Procedure |
27 | Figure 1 — Setup for measuring stability against temperature |
28 | Figure 2 — Circuit to protect the instrument from the transmitter pulse 8.2.28.4.2 Acceptance criterion 8.38.5 Stability against voltage variation 8.3.18.5.1 Procedure |
29 | 8.3.28.5.2 Acceptance criterion 8.6 Time base deviation 8.6.1 Procedure |
30 | Figure 3 — Setup of equipment for multiple tests |
31 | 8.6.2 Acceptance criterion 8.48.7 Transmitter pulse parameters 8.4.18.7.1 General 8.4.28.7.2 Pulse repetition frequency 8.4.2.28.7.2.2 Acceptance criterion 8.4.38.7.3 Effective output impedance 8.4.3.18.7.3.1 Procedure |
32 | 8.4.3.28.7.3.2 Acceptance criterion 8.4.4 Transmitter pulse frequency spectrum 8.4.4.1 Procedure 8.4.4.2 Acceptance criterion 8.58.8 Receiver 8.5.18.8.1 General 8.5.28.8.2 Cross talk from transmitter to receiver during transmission |
33 | Figure 4 — Equipment setup used to measure cross talk 8.5.2.28.8.2.2 Acceptance criterion 8.5.38.8.3 Dead time after transmitter pulse |
34 | Figure 5 — Equipment setup used to measure dead time after the transmitter pulse |
35 | 8.5.3.2 Acceptance criterion Figure 6 — Waveform used to measure dead time after the transmitter pulse as seen on the instrument screen during the test 8.8.3.2 Acceptance criterion 8.5.48.8.4 Dynamic range and maximum input voltage |
36 | Figure 7 — Test waveform generated by general purpose equipment setup |
37 | 8.5.4.28.8.4.2 Acceptance criteria 8.5.58.8.5 Receiver input impedance 8.5.5.18.8.5.1 Procedure 8.5.5.28.8.5.2 Acceptance criterion 8.5.68.8.6 Time-dependent‑corrected gain (TDGTCG) |
38 | 8.5.6.28.8.6.2 Acceptance criterion 8.5.7 Temporal resolution 8.5.7.1 Procedure The widest band setting of the equipment is selected. Set the equipment in Figure 6 to generate two single cycle measurement pulses with centre frequency fo measured in 9.5.2 for the frequency band chosen. These pulses should follow each other at a di… |
39 | Increase the amplitude of the first measurement pulse by 20 dB, while maintaining the amplitude of the second pulse as 80 % of screen height. Decrease the distance between the two measurement pulses until the dip between both of them is 6 dB (relative… 8.9 Gates 8.9.1 General Figure 8 — Timing diagram of signals used to test a monitor gate |
40 | 8.9.2 Gates with value output 8.9.2.1 Linearity of the amplitude in the gate Table 3 — Expected gate amplitude for specified attenuator settings 8.9.2.1.2 Acceptance criterion 8.9.2.2 Linearity of time of flight in the gate |
41 | Table 4 — Expected gate TOF for specified positions in the screen width 8.9.3 Gates with analogue output 8.9.3.1.1 Procedure 8.9.3.1.2 Acceptance criterion |
42 | 8.9.3.2 Linearity of analogue output Table 5 — Expected output voltage for specified attenuator settings 8.9.3.2.2 Acceptance criterion 8.9.3.3 Influence of the signal position within the gate 8.9.3.3.1 Procedure |
43 | 8.9.3.3.2 Acceptance criterion 8.9.3.4 Rise time, fall time, delay time and hold time of analogue output 8.9.3.4.1 Procedure 8.5.7.28.9.3.4.2 Acceptance criterion 8.9.4 Gates with alarm output |
44 | 8.6.28.9.4.2 Response threshold and switching hysteresis with a fixed monitor threshold 8.9.4.3 Delay time and hold time of the gate alarm 8.6.3 Hold time of the switched output 8.6.3.28.9.4.3.2 Acceptance criterioncriteria 8.7.1 Impedance of proportional output 8.7.1.1 Procedure |
45 | 8.7.2 Linearity of proportional output 8.7.2.1 Procedure Table 3 — Expected output voltage for specified attenuator settings |
46 | 8.7.2.2 Acceptance criterion 8.7.3 Frequency response of proportional gate output 8.7.3.1 Procedure 8.7.3.2 Acceptance criterion 8.7.4 Noise on proportional gate output 8.7.4.1 Procedure 8.7.4.2 Acceptance criterion 8.7.5 Influence of the measurement signal position within the gate 8.7.5.1 Procedure |
47 | 8.7.5.2 Acceptance criterion 8.7.6 Effect of pulse shape on the proportional gate output 8.7.6.1 Procedure 8.7.6.2 Acceptance criterion 8.7.7 Rise, fall and hold time of proportional gate output 8.7.7.1 Procedure 8.7.7.2 Acceptance criterion |
48 | 8.8.1 General 8.8.2 Linearity of time-base for digital ultrasonic instruments 8.8.2.1 Procedure 8.8.2.2 Acceptance criterion 8.8.3 Digitisation sampling error 8.8.3.1 Procedure 8.10.1 Procedure 8.10.1.1 General |
49 | 8.10.1.2 Method A 8.10.1.3 Method B Figure 9 — Waveform used with method B to measure the digitisation sampling error |
50 | 8.8.2.28.10.2 Acceptance criterion 8.8.48.11 Response time of digital ultrasonic instruments 8.8.4.18.11.1 ProcedureGeneral 8.11.2 Procedure |
51 | Figure 10 — Timing diagram showing how to measure the response time of digital ultrasonic instruments 8.8.4.28.11.3 Acceptance criterion 9 Group 2 tests 9.1 Equipment required for group 2 tests |
52 | 9.2 Physical state and external aspects 9.2.1 Procedure 9.2.2 Acceptance criterion 9.3.1 General 9.3.2 Stability after warm-up time 9.3.2.1 Procedure 9.3.2.2 Acceptance criteria |
53 | 9.3.3 Display jitter 9.3.3.1 Procedure 9.3.3.2 Acceptance criteria 9.3.4 Stability against voltage variations 9.3.4.1 Procedure 9.3.4.2 Acceptance criteria 9.4.1 General 9.4.29.3 Transmitter voltage, pulse rise time, reverberation and duration 9.4.2.19.3.1 Procedure |
54 | Figure 11 — Instrumentation for pulse measurements |
55 | Figure 12 — Transmitter pulse parameters to be measured |
56 | 9.4.2.29.3.2 Acceptance criteria 9.59.4 Receiver 9.5.19.4.1 General 9.5.29.4.2 Amplifier frequencyFrequency response |
57 | Figure 13 — Receiver section frequency characteristics 9.5.2.2 Acceptance criteria |
58 | 9.4.2.2 Acceptance criteria 9.5.3 Equivalent input noise 9.5.3.1 Procedure 9.4.3 Noise level 9.4.3.1 Procedure 9.4.3.2 Method A 9.4.3.3 Method B |
59 | 9.5.3.29.4.3.4 Acceptance criterion 9.5.4 Accuracy of calibrated attenuator 9.4.4 Gain linearity |
60 | 9.5.4.2 Acceptance criteria 9.4.4.2 Acceptance criteria 9.5.5 Linearity of vertical display 9.4.5 Vertical display linearity |
61 | Table 4Table 6 — Acceptance levels for vertical display linearity 9.6.1 Procedure 9.6.2 Acceptance criterion |
62 | Key Figure 2 — Circuit to protect equipment from the transmitter pulse Figure 3 — Equipment set-up used to measure cross-talk damping |
63 | Figure 4 — Equipment set-up used to measure dead time after the transmitter pulse |
64 | Key Figure 5 — Waveform used to measure dead time after the transmitter pulse as seen on the instrument screen during the test |
65 | Figure 6 — General purpose set-up for equipment |
66 | Key Figure 7 — Test waveform generated by general purpose equipment set-up Figure 8 — Set-up of equipment for tests on monitor gate |
67 | Figure 9 — Timing diagram of signals used to test monitor gate |
68 | Key Figure 10 — Timing diagram showing how to measure the response time of digital flaw detectors |
69 | Figure 11 — Transmitter pulse parameters to be measured |
70 | Key Figure 12 — Signals used to test time base linearity |
71 | Special conditions for ultrasonic instruments with logarithmic amplifiers A.1 IntroductionGeneral A.2 Basic requirements A.2.1 Measuring accuracy A.2.2 Vertical display “linearity A.3A.2.3 Tests |
72 | Bibliography |
74 | National foreword |
76 | European foreword |
79 | Foreword |
81 | 1 Scope 2 Normative references 3 Terms and definitions |
83 | 4 Symbols |
84 | 5 General requirements of conformity 6 Manufacturer’s technical specification for ultrasonic instruments |
87 | 7 Performance requirements for ultrasonic instruments |
89 | 8 Group 1 tests 8.1 Equipment required for group 1 tests |
90 | 8.2 Battery operational time 8.2.1 Procedure 8.2.2 Acceptance criterion 8.3 Stability after warm-up time 8.3.1 Procedure 8.3.2 Acceptance criteria |
91 | 8.4 Stability against temperature 8.4.1 Procedure |
93 | 8.4.2 Acceptance criterion 8.5 Stability against voltage variation 8.5.1 Procedure |
94 | 8.5.2 Acceptance criterion 8.6 Time base deviation 8.6.1 Procedure |
96 | 8.6.2 Acceptance criterion 8.7 Transmitter pulse parameters 8.7.1 General 8.7.2 Pulse repetition frequency 8.7.3 Effective output impedance |
97 | 8.8 Receiver 8.8.1 General 8.8.2 Cross talk from transmitter to receiver during transmission |
98 | 8.8.3 Dead time after transmitter pulse |
100 | 8.8.4 Dynamic range and maximum input voltage |
101 | 8.8.5 Receiver input impedance |
102 | 8.8.6 Time-corrected gain (TCG) |
103 | 8.9 Gates 8.9.1 General |
104 | 8.9.2 Gates with value output |
106 | 8.9.3 Gates with analogue output |
108 | 8.9.4 Gates with alarm output |
109 | 8.10 Highest digitized frequency 8.10.1 Procedure |
110 | 8.10.2 Acceptance criterion 8.11 Response time of digital ultrasonic instruments 8.11.1 General 8.11.2 Procedure |
111 | 8.11.3 Acceptance criterion 9 Group 2 tests 9.1 Equipment required for group 2 tests |
112 | 9.2 Physical state and external aspects 9.2.1 Procedure 9.2.2 Acceptance criterion 9.3 Transmitter voltage, pulse rise time and duration 9.3.1 Procedure |
115 | 9.3.2 Acceptance criteria 9.4 Receiver 9.4.1 General 9.4.2 Frequency response |
117 | 9.4.3 Noise level |
118 | 9.4.4 Gain linearity 9.4.5 Vertical display linearity |
120 | Annex A (normative) Special conditions for ultrasonic instruments with logarithmic amplifiers |
121 | Bibliography |