BS IEC 62526:2007
$215.11
Standard for extensions to standard test interface language (STIL) for semiconductor design environments
| Published By | Publication Date | Number of Pages |
| BSI | 2007 | 124 |
Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.
