BS ISO 16700:2016 – TC:2020 Edition
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Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
Published By | Publication Date | Number of Pages |
BSI | 2020 | 58 |
PDF Catalog
PDF Pages | PDF Title |
---|---|
34 | Foreword |
35 | Introduction |
37 | 1 Scope 2 Normative references 3 Terms and definitions |
39 | 4 Image magnification 4.1 Scale marker 4.2 Expressing magnification 5 Reference material 5.1 General |
40 | 5.2 Requirements for CRM 5.3 Pitch patterns on CRM 5.4 Storage and handling |
41 | 6 Calibration procedures 6.1 General 6.2 Mounting CRM 6.3 Setting SEM operation conditions for calibration |
42 | 6.4 Image recording 6.5 Measurement of image |
43 | 6.6 Calibration of magnification and scale marker 6.6.1 General 6.6.2 Magnification 6.6.3 Scale marker |
44 | 7 Accuracy of image magnification and scale marker |
45 | 8 Calibration report 8.1 General 8.2 Contents of calibration report |
47 | Annex A (informative) Reference materials for magnification |
49 | Annex B (informative) Parameters that influence the resultant magnification of an SEM |
51 | Annex C (informative) Uncertainties in magnification measurements |
52 | Annex D (informative) Example of a test report |
54 | Bibliography |