BS ISO 24173:2009
$198.66
Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
| Published By | Publication Date | Number of Pages |
| BSI | 2009 | 54 |
This International Standard gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 9 | Scope Normative references Terms and definitions |
| 15 | Equipment for EBSD |
| 16 | Operating conditions Specimen preparation |
| 17 | Specimen alignment Common steps in collecting an EBSP Setting the microscope operating conditions Accelerating voltage Probe current Detector and working distances |
| 18 | Camera integration/exposure time Binning |
| 19 | EBSP averaging EBSP background correction/EBSP signal correction |
| 20 | Band detection |
| 21 | Calibrations required for indexing of EBSPs |
| 24 | Analytical procedure Pre-test preparation |
| 25 | Operating conditions Equipment stability check EBSD analysis Measurement uncertainty General Uncertainty of crystal orientation measurement |
| 26 | Absolute orientation Relative orientation Reporting the results |
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ISO 24173:2009
Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction Published By Publication Date…
