BS ISO 24173:2024
$189.07
Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
Published By | Publication Date | Number of Pages |
BSI | 2024 | 50 |
PDF Catalog
PDF Pages | PDF Title |
---|---|
2 | undefined |
6 | Foreword |
7 | Introduction |
9 | 1 Scope 2 Normative references 3 Terms and definitions |
14 | 4 Equipment for EBSD |
15 | 5 Operating conditions 5.1 Specimen preparation 5.2 Specimen alignment 5.3 Common steps in collecting an EBSP 5.3.1 Setting the microscope operating conditions |
16 | 5.3.2 Detector and working distances 5.3.3 Camera integration/exposure time 5.3.4 Binning |
17 | 5.3.5 EBSP averaging 5.3.6 EBSP background correction/EBSP signal correction |
18 | 5.3.7 Band detection |
19 | 6 Calibrations required for indexing of EBSPs |
22 | 7 Analytical procedure 7.1 Operating conditions |
23 | 7.2 Equipment stability check 7.3 EBSD analysis 8 Measurement uncertainty 8.1 General 8.2 Uncertainty of crystal orientation measurement 8.3 Absolute orientation 8.4 Relative orientation |
24 | 9 Reporting the results |
25 | Annex A (informative) Principle of EBSD |
26 | Annex B (informative) Specimen preparation for EBSD |
32 | Annex C (informative) Brief introduction to crystallography and EBSP indexing, and other information useful for EBSD |
47 | Bibliography |