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BS ISO/IEC 29158:2020

BS ISO/IEC 29158:2020

$167.15

Information technology. Automatic identification and data capture techniques. Direct Part Mark (DPM) Quality Guideline

Published By Publication Date Number of Pages
BSI 2020 42
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This document is an engineering document intended for verifier manufacturers and application specification developers.

This document describes modifications to the symbol quality methodology defined in ISO/IEC 15415 and a symbology specification. It defines alternative illumination conditions, some new terms and parameters, modifications to the measurement and subsequent grading of certain parameters and the reporting of the grading results.

This document was developed to assess the symbol quality of direct marked parts, where the mark is applied directly to the surface of the item and the reading device is a two-dimensional imager.

When application specifications allow, this method is also potentially applicable to symbols produced by other methods. This is appropriate when direct part marked (DPM) symbols and non-DPM symbols are being scanned in the same scanning environment. The symbol grade is reported as a DPM grade rather than as an ISO/IEC 15415 grade.

PDF Catalog

PDF Pages PDF Title
2 undefined
7 Foreword
8 Introduction
9 1 Scope
2 Normative references
3 Terms and definitions
10 4 Symbols and abbreviated terms
5 Overview of methodology
5.1 Process differences from ISO/IEC 15415
11 5.2 Lighting
5.3 Tilted coaxial lighting and camera position (TCL)
12 6 Obtaining the image
6.1 Camera position and symbol orientation
6.1.1 Symbol placement
13 6.1.2 Camera position in a 90 ° camera angle set up
6.1.3 TCL setup
6.2 Lighting environments
6.2.1 General
6.2.2 Perpendicular coaxial (90)
6.2.3 Diffuse off-axis (D)
6.2.4 Four direction (angle Q)
6.2.5 Two direction (angle T)
14 6.2.6 One direction (angle S)
6.2.7 TCL Setup
6.3 Image focus
6.4 Depth of field
6.5 System response adjustment and reflectance calibration
15 7 Verifying a symbol
7.1 Initial image reflectance
7.1.1 General
7.1.2 Initialize aperture size
7.1.3 Create initial histogram
7.1.4 Compute mean
7.1.5 Optimize image
7.2 Obtaining the test image
7.2.1 Matrix symbologies
7.2.2 Binarize image
16 7.3 Apply Reference Decode Algorithm
7.3.1 General
7.3.2 Repeat if necessary
7.3.3 Continue until end
7.4 Final image adjustment
7.4.1 General
7.4.2 Determine grid-point reflectance with two apertures
7.4.3 Create a grid-point histogram
7.4.4 Measure mean light (ML)
7.4.5 Record parameters
17 7.4.6 Create binarized images for the symbology reference decode
7.4.7 Decode
8 Determine contrast parameters
8.1 Initialize aperture size
8.2 Calculate cell contrast (CC)
8.3 Calculate cell module modulation (CMOD)
8.4 Calculate minimum reflectance (Rtarget)
18 9 Grading
9.1 Cell contrast (CC)
9.2 Minimum reflectance (Rtarget)
19 9.3 Cell modulation (CM)
9.4 Fixed pattern damage (FPD)
20 9.5 Final grade
10 Communicating grade requirements and results
10.1 General
10.2 Communication of application requirements
10.3 Communicating from verifier to application
10.4 Communicating the use of a proprietary decode
22 Annex A (normative) Threshold determination method
26 Annex B (informative) Evaluation of image at virtual 90° camera position from real tilted camera position
30 Annex C (normative) Continuous grading for ISO/IEC 15415 parameters
35 Annex D (normative) Dot connecting algorithm
37 Annex E (informative) Communicating the grade
40 Annex F (informative) Cross reference to ISO/IEC 15415
41 Bibliography

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BS ISO/IEC 29158:2020
$167.15