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BSI 20/30425836 DC 2020

BSI 20/30425836 DC 2020

$13.70

BS EN IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods – Part 37. Board level drop test method using an accelerometer

Published By Publication Date Number of Pages
BSI 2020 24
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Status

Definitive
Pages

24
Publication Date

2020-10-23
Standard Number

20/30425836 DC
Title

BS EN IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods – Part 37. Board level drop test method using an accelerometer
Identical National Standard Of

IEC 60749-37 Ed.2.0
Descriptors

Printed-circuit boards, Electronic equipment and components, Integrated circuits, Surface mounting devices, Accelerated testing, Environmental testing, Drop tests, Semiconductor devices, Mechanical testing, Impact testing
Publisher

BSI
Committee

EPL/47
ICS Codes 31.080.01 - Semiconductor devices in general

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BSI 20/30425836 DC 2020
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