BSI PD IEC/TS 62915:2018
$167.15
Photovoltaic (PV) modules. Type approval, design and safety qualification. Retesting
| Published By | Publication Date | Number of Pages |
| BSI | 2018 | 36 |
IEC TS 62915:2018(E) sets forth a uniform approach to maintain type approval, design and safety qualification of terrestrial PV modules that have undergone, or will undergo modification from their originally assessed design. Changes in material selection, components and manufacturing process can impact electrical performance, reliability and safety of the modified product. This document lists typical modifications and the resulting requirements for retesting based on the different test standards. This document is closely related to the IEC 61215 and IEC 61730 series of standards.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | undefined |
| 4 | CONTENTS |
| 6 | FOREWORD |
| 8 | 1 Scope 2 Normative references |
| 9 | 3 Terms and definitions 4 Retesting 4.1 General |
| 10 | 4.2 Test programs for crystalline silicon PV modules 4.2.1 Modification to frontsheet |
| 11 | 4.2.2 Modification to encapsulation system |
| 12 | 4.2.3 Modification to cell technology 4.2.4 Modification to cell and string interconnect material or technique |
| 13 | 4.2.5 Modification to backsheet |
| 14 | 4.2.6 Modification to electrical termination 4.2.7 Modification to bypass diode |
| 15 | 4.2.8 Modification to electrical circuitry 4.2.9 Modification to edge sealing |
| 16 | 4.2.10 Modification to frame and/or mounting structure 4.2.11 Change in PV module size |
| 17 | 4.2.12 Higher or lower output power (by 10 % or more) with the identical design and size and using the identical cell process 4.2.13 Increase of over-current protection rating 4.2.14 Increase of system voltage 4.2.15 Change in cell fixing tape 4.3 Test programs for thin-film PV modules |
| 18 | 4.3.1 Modification to frontsheet 4.3.2 Modification to encapsulation system |
| 19 | 4.3.3 Modification to front contact (e. g. TCO) 4.3.4 Modification to cell technology |
| 20 | 4.3.5 Modification to cell layout 4.3.6 Modification to back contact |
| 21 | 4.3.7 Modification to edge deletion 4.3.8 Modification to interconnect material or technique 4.3.9 Modification to backsheet |
| 22 | 4.3.10 Modification to electrical termination |
| 23 | 4.3.11 Modification to bypass diode |
| 24 | 4.3.12 Modification to edge sealing 4.3.13 Modification to frame and/or mounting structure |
| 25 | 4.3.14 Change in PV module size 4.3.15 Higher or lower output power (by 10 % or more) with the identical design and size 4.3.16 Increase of over-current protection rating 4.3.17 Increase of system voltage |
| 27 | Annex A (informative) A.1 Required retests for crystalline silicon PV modules, tabular overview Tables Table A.1 – Required retests for crystalline silicon PV modules |
| 29 | A.2 Required retests for thin-film PV modules, tabular overview Table A.2 – Required retests for thin-film silicon PV modules |
| 31 | A.3 Combined test flow IEC 61215 and IEC 61730 (see Figure A.1 and Table A.3) Figures Figure A.1 – Combined test flow IEC 61215 and IEC 61730 |
| 32 | Table A.3 – IEC identifiers for test sequences |
| 33 | A.4 Tests for new combinations of material in direct contact with each other |
| 34 | Table A.4 – Example for required tests for new material combinations |
| 35 | Figure A.2 – Illustration of example for required tests for new material combinations |
