IEC 62525:2007

$76.05

Standard Test Interface Language (STIL) for Digital Test Vector Data

Published By	Publication Date	Number of Pages
IEC	2007-11-07	148

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Categories: 19.080 - Electrical and electronic testing, 25.040.01 - Industrial automation systems in general, IEC

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Description

Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.

Additional information

Published Code	IEC
Published By	International Electrotechnical Commission
Publication Date	2007-11-07
Pages Count	148
Language	English
Edition	1.0
File Size	1.3 MB
ICS Codes	19.080 - Electrical and electronic testing 25.040.01 - Industrial automation systems in general

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IEC 62525:2007

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