IEC 62526:2007
$76.05
Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
| Published By | Publication Date | Number of Pages |
| IEC | 2007-11-07 | 128 |
Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.
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