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IEEE 837 2003

$42.25

IEEE Standard for Qualifying Permanent Connections Used in Substation Grounding

Published By Publication Date Number of Pages
IEEE 2003 34
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Revision Standard – Active. Direction and methods for qualifying permanent connections used for substation grounding are provided in this standard. This standard particularly addresses the connection used within the grid system, the connection used to join ground leads to the grid system, and the connection used to join the ground leads to equipment and structures.

PDF Catalog

PDF Pages PDF Title
1 Cover Page
2 Title Page
4 Introduction
Participants
6 CONTENTS
8 1. Overview
1.1 Scope
1.2 Purpose
2. References
10 3. Definitions
4. Qualification tests
11 5. Performance criteria
5.1 General
5.2 Mechanical tests
5.3 Sequential tests
15 6. Test procedures
6.1 General
6.2 Mechanical test samples
6.3 Sequential test samples
6.4 Connection description
6.5 Test conductors
6.6 Test assembly methods
6.7 Connection preparation
6.8 Installation
16 7. Mechanical tests
7.1 General
7.2 Mechanical pullout test
17 7.3 Electromagnetic force test
18 8. Current-temperature cycling test
8.1 General
8.2 Current-temperature cycling test
19 8.3 Ambient conditions
8.4 Control conductor
20 8.5 Current cycling
21 8.6 Current cycling loop configuration
8.7 Current cycling measurements
22 9. Freeze-thaw test
9.1 General
9.2 Freeze-thaw test
9.3 Freeze-thaw test samples and their configuration
23 9.4 Freeze-thaw test equipment
9.5 Freeze-thaw test cycle
10. Corrosion tests
10.1 General
10.2 Corrosion test-salt spray
24 10.3 Corrosion test-acid (HNO3)
25 11. Fault-current test
11.1 General
11.2 Fault-current test
11.3 Fault-current test samples
11.4 Fault-current test configuration
11.5 Fault-current test duration
26 11.6 Fault-current test current
11.7 Fault-current number of surges
11.8 Fault-current test evaluation
27 Annex A (informative) Bibliography
28 Annex B (informative) Nitric acid dilution
29 Annex C (normative) Conductor ampacity calculation
32 Annex D (informative) Test sequencing
IEEE 837 2003
$42.25