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IEEE C63.4-2003

$98.04

IEEE Standard for Methods of Measurement of Radio-Noise Emission from Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz

Published By Publication Date Number of Pages
IEEE 2003
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Revision Standard – Superseded. U.S. consensus standard methods, instrumentation, and facilities for measurement of radio-frequency (RF) signals and noise emitted from electrical and electronic devices in the frequency range 9 kHz to 40 GHz are specified. This standard does not include generic nor product-specific emission limits. Where possible, the specifications herein are harmonized with other national and international standards used for similar purposes.

PDF Catalog

PDF Pages PDF Title
1 Cover Page
2 Title Page
4 Introduction
5 Participants
7 CONTENTS
10 1. Overview
1.1 Scope
11 1.2 Applications
12 2. References
14 3. Definitions and acronyms
3.1 Definitions (see L.2 in Annex L for definitions on testing in TEM waveguides)
16 3.2 Acronyms
17 4. Measurement instrumentation
4.1 General
23 4.2 Detector function/selection of bandwidth
4.3 Receiver monitoring
4.4 Calibration of measuring equipment
25 5. Test facilities
5.1 General requirements
5.2 AC powerline conducted emission test requirements
27 5.3 Radiated emission tests (below 30 MHz)
5.4 Radiated emission tests (30 MHz to 1 GHz)
40 5.5 Radiated emission test site requirements above 1 GHz
5.6 Testing at manufacturer’s location or user’s installation
5.7 Artificial hand [CISPR 16-1-1 (2003-11), Clause 21]
42 6. General requirements for EUT equipment arrangements and operation
6.1 Operating conditions
51 6.2 Arrangement of EUT
57 7. AC powerline conducted emission measurements
7.1 Measurement requirements
7.2 Measurement procedures
59 8. Radiated emission measurements
8.1 Measurement requirements
8.2 Antenna selection, location, and measuring distance
61 8.3 Radiated emission measurement procedures
63 9. Radio-noise power
9.1 Absorbing clamp measurement procedures
64 10. Test reports
10.1 Test report content
68 10.2 Test report disposition
11. Measurement of information technology equipment (ITE)
11.1 Operating conditions
69 11.2 Tabletop equipment arrangement
71 11.3 Floor-standing equipment arrangement
11.4 Combination tabletop and floor-standing equipment arrangement
11.5 AC powerline conducted emission measurements
72 11.6 Radiated emission measurements
73 12. Measurement of unintentional radiators other than ITE
12.1 Measurement of receivers
76 12.2 Measurement of TV interface devices
82 13. Measurement of intentional radiators
13.1 Requirements of intentional radiators
88 13.2 Requirements of field disturbance sensors (RF intrusion alarms)
14. Limit relaxation for transients
89 Annex A (informative) Site attenuation using discrete frequencies
92 Annex B (informative) Site attenuation using swept frequencies
93 Annex C (informative) Method of exploratory radiated emission maximization
94 Annex D (informative) Step-by-step guidance for testing personal computers and associated peripherals
98 Annex E (informative) Verification of LISN characteristics
101 Annex F (informative) Absorbing clamp
102 Annex G (informative) Step-by-step guidance for testing unintentional radiators other than ITE
113 Annex H (informative) Step-by-step guidance for testing intentional radiators
121 Annex I (informative) Applicable clause of C63.4 by equipment type
125 Annex J (informative) Construction and use of the artificial hand
126 Annex K (informative) United States standards that require emissions measurements below 9 kHz
127 Annex L (normative) Test procedure for emissions testing in TEM waveguides
137 Annex M (informative) Sample OATS to TEM waveguide validation spreadsheet
139 Annex N (informative) Bibliography
142 Keyword Index
IEEE C63.4-2003
$98.04