TIA-455-106:1992
$29.25
FOTP-106 Procedures for Determining Threshold Current of Semiconductor Lasers
| Published By | Publication Date | Number of Pages |
| TIA | 1992 | 23 |
This test covers the wavelength range from 600 nanometers to
1700 nanometers using a spectrophotometer capable of generating
visible and near-infrared light. This method covers primary,
secondary, and single coatings (e.g., acrylate, polyimide, and
silicone), as well as pigmented coatings, that can be prepared in
film specimens.
