29.035.01 – Insulating materials in general – PDF Standards Store ?u= Wed, 06 Nov 2024 02:00:53 +0000 en-US hourly 1 https://wordpress.org/?v=6.7.1 ?u=/wp-content/uploads/2024/11/cropped-icon-150x150.png 29.035.01 – Insulating materials in general – PDF Standards Store ?u= 32 32 JIS C 4003:2010 ?u=/product/publishers/jis/jis-c-40032010/ Wed, 06 Nov 2024 02:00:53 +0000 Electrical insulation - Thermal evaluation and designation
Published By Publication Date Number of Pages
JIS 2010-12-20 12
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This Standard distinguishes between the thermal class for electrical insulation system (EIS) and the thermal class for electrical insulating material (ElM), and establishes the procedures for designating the criteria for the thermal evaluation and also the thermal class for both the electrical insulating material and the electrical insulation system.

This Standard is applicable to the cases where the thermal factor is the dominant ageing factor.

NOTE 1 A thermal class of a certain electrical insulation system cannot be assigned to the electrical insulating material which is used therein solely because of its use in the electrical insulation system.

NOTE 2 The International Standard corresponding to this Standard and the symbol of degree of correspondence are as follows.

IEC 60085 : 2007 Electrical insulation – Thermal evaluation and designation (MOD)

The symbols which denote the degree of correspondence in the contents between the relevant International Standard and JIS are IDT (identical), MOD (modified), and NEQ (not equivalent) according to ISO/IEC Guide 21-1.

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JIS C 3660-1-2:2003 ?u=/product/publishers/jis/jis-c-3660-1-22003/ Wed, 06 Nov 2024 02:00:30 +0000 Common test methods for insulating and sheathing materials of electric and optical cables - Part 1-2: Methods for general application - Thermal ageing methods
Published By Publication Date Number of Pages
JIS 2003-09-20 16
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Common test methods for insulating and sheathing materials of electric and optical cables - Part 1-2: Methods for general application - Thermal ageing methods
Published By Publication Date Number of Pages
JIS 2003-09-20 16
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JIS C 3660-1-3:2003 ?u=/product/publishers/jis/jis-c-3660-1-32003/ Wed, 06 Nov 2024 02:00:30 +0000 Common test methods for insulating and sheathing materials of electric and optical cables - Part 1-3: Methods for general application - Methods for determining the density - Water absorption tests - Shrinkage test
Published By Publication Date Number of Pages
JIS 2003-09-20 13
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Common test methods for insulating and sheathing materials of electric and optical cables-Part 1-3 : Methods for general application- Methods for determining the density-Water absorption tests-

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JIS C 3660-1-4:2003 ?u=/product/publishers/jis/jis-c-3660-1-42003/ Wed, 06 Nov 2024 02:00:30 +0000 Common test methods for insulating and sheathing materials of electric and optical cables - Part 1-4: Methods for general application - Test at low temperature
Published By Publication Date Number of Pages
JIS 2003-09-20 15
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and sheathing materials of electric and optical cables-Part 1-4 :

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JIS C 3660-1-1:2003 ?u=/product/publishers/jis/jis-c-3660-1-12003/ Wed, 06 Nov 2024 02:00:29 +0000 Common Test Methods for Insulating and Sheathing Materials of Electric and Optical Cables - Part 1-1: Methods for General Application - Measurement of Thickness and Overall Dimensions - Tests for Determining the Mechanical Properties
Published By Publication Date Number of Pages
JIS 2003-09-20 22
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Common Test Methods for Insulating and Sheathing Materials of Electric and Optical Cables - Part 1-1: Methods for General Application - Measurement of Thickness and Overall Dimensions - Tests for Determining the Mechanical Properties
Published By Publication Date Number of Pages
JIS 2003-09-20 22
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JIS C 2162:2010 ?u=/product/publishers/jis/jis-c-21622010/ Wed, 06 Nov 2024 01:58:38 +0000 Test method of long-term reliability of gate insulator for SiC devices at high temperature
Published By Publication Date Number of Pages
JIS 2010-03-23 14
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This Japanese Industrial Standard specifies the matters related to the "long-term reliability test of gate insulator for silicon carbide (SiC) devices at high temperature" (hereafter referred to as the "long-term reliability test"), namely, the test apparatus used, the structure of a sample, the method for eliminating the effect of defects in an SiC substrate and the test procedure.

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JIS C 2142:2009 ?u=/product/publishers/jis/jis-c-21422009/ Wed, 06 Nov 2024 01:58:34 +0000 Solid electrical insulating materials - Standard conditions for use prior to and during the testing
Published By Publication Date Number of Pages
JIS 2009-05-20 17
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This Standard gives standard conditions of exposure time, temperature, atmospheric humidity and liquid immersion for use in testing electrical insulating materials.

The range is sufficiently wide to enable suitable conditions to be selected so that either of the primary objects of conditioning can be achieved.

These objects are:

a) To obtain greater reproducibility of test results by:

1) partly counteracting the variations of the properties of the material due to the past history of the test specimens, and

2) ensuring uniformity of conditions during the testing.

b) To determine the influence of exposure to certain temperatures and humidities, or immersions in liquids, on the properties of a material by subjecting specimens to specified conditions before or during the test or both.

NOTE : The International Standard corresponding to this Standard and the symbol of degree of correspondence are as follows.

IEC 60212 : 1971 Standard conditions for use prior to and during the testing of solid electrical insulating materials (MOD)

The symbols which denote the degree of correspondence in the contents between JIS and the corresponding International Standard are IDT (identical), MOD (modified) and NEQ (not equivalent) according to ISO/ IEC Guide 21.

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JIS C 2136:2004 ?u=/product/publishers/jis/jis-c-21362004/ Wed, 06 Nov 2024 01:58:33 +0000 Test Method for Evaluating Resistance to Tracking and Erosion of Electrical Insulating Materials Used Under Severe Ambient Conditions
Published By Publication Date Number of Pages
JIS 2004-12-20 16
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Test method for evaluating resistance to tracking and erosion of electrical in- sulating materials used under severe ambient conditions

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JIS C 2135:2011 ?u=/product/publishers/jis/jis-c-21352011/ Wed, 06 Nov 2024 01:58:33 +0000 Dry, solid insulating materials-Resistance test to high-voltage low-current arc discharges
Published By Publication Date Number of Pages
JIS 2011-12-20 20
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This Standard describes a test method which can provide preliminary differentiation between similar insulating materials (hereafter referred to as "materials"), with respect to their resistance to damage when exposed to high-voltage, low-current arc discharges, occurring close to their surface.

The discharges cause localized thermal and chemical decomposition and erosion and eventually a conductive path forms across the insulating material.

The severity of the test conditions is gradually increased: in the early stages a low-current arc discharge is repeatedly interrupted, whereas in the later stages, the arc current is raised in successive steps.

Because of its convenience and because of the short time required for testing, the test method is applicable for preliminary screening of materials, for detecting of effects of changes in formulation and for quality control testing.

Previous experience with this test showed acceptable reproducibility with thermoset materials.

Using thermoplastics, some testing laboratories report unacceptably large variation in test results which lead to the recommendation not to use the test for thermoplastics.

NOTE 1 Attempts are being made to reduce the variability of the results of tests on thermoplastics by controlling the electrode pressure and depth of penetration into the material during the test.

Without such electrode control, tests on many thermoplastics may not be sufficiently meaningful to be performed.

This test method will not, in general, permit conclusions to be drawn concerning the relative arc resistance rankings of materials which may be subjected to other types of arcs.

The ranking of material may differ from that found in wet tracking tests (for example, JIS C 2134, JIS C 2136 and JIS C 2137) and from their performance in service, where the intensity, recurrence frequency and time of exposure to arc discharges are very different.

NOTE 2 The International Standard corresponding to this Standard and the symbol of degree of correspondence are as follows.

IEC 61621 : 1997 Dry, solid insulating material~Resistance test to high-voltage) low-current arc discharges (MOD)

In addition, symbols which denote the degree of correspondence in the contents between the relevant International Standard and JIS are IDT (identical), MOD (modified), and NEQ (not equivalent) according to ISO/IEC Guide 21-1.

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JIS C 2140:2009 ?u=/product/publishers/jis/jis-c-21402009/ Wed, 06 Nov 2024 01:58:33 +0000 Solid electrical insulating materials - Methods of determination of the insulation resistance
Published By Publication Date Number of Pages
JIS 2009-05-20 18
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This Standard specifies test methods which cover procedures for the determination of insulation resistance without discrimination between the volume and surface resistances involved.

Because the test specimens are simply and easily prepared, these methods are particularly useful for rapidly determining values which will give a general indication of quality when great accuracy is not required.

NOTE: The International Standard corresponding to this Standard and the symbol of degree of correspondence are as follows.

IEC 60167: 1964 Methods of test for the determination of the insulation resistance of solid insulating materials (MOD)

The symbols which denote the degree of correspondence in the contents between JIS and the corresponding International Standard are IDT (identical), MOD (modified) and NEQ (not equivalent) according to ISO/IEC Guide 21.

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