71.040.40 - Chemical analysis
Showing 193–208 of 1123 results
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ISO 22048:2004
Surface chemical analysis — Information format for static secondary-ion mass spectrometry Published By Publication Date…
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ISO 21270:2004
Surface chemical analysis — X-ray photoelectron and Auger electron spectrometers — Linearity of intensity scale…
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ISO 21222:2020
Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli…
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ISO 21079-3:2008
Chemical analysis of refractories containing alumina, zirconia, and silica — Refractories containing 5 percent to…
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ISO 21079-2:2008
Chemical analysis of refractories containing alumina, zirconia, and silica — Refractories containing 5 percent to…
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ISO 21079-1:2008
Analyse chimique des matériaux réfractaires contenant de l’alumine, de la zircone et de la silice…
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ISO 20903:2019
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to…
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ISO 20903:2011
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to…
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ISO 20579-4:2018
Surface chemical analysis — Guidelines to sample handling, preparation and mounting — Part 4: Reporting…
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ISO 20579-3:2021
Surface chemical analysis — Sample handling, preparation and mounting — Part 3: Biomaterials Published By…
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ISO 20411:2018
Surface chemical analysis — Secondary ion mass spectrometry — Correction method for saturated intensity in…
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ISO 20341:2003
Surface chemical analysis — Secondary-ion mass spectrometry — Method for estimating depth resolution parameters with…
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ISO 20289:2018
Surface chemical analysis — Total reflection X-ray fluorescence analysis of water Published By Publication Date…
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ISO 19830:2015
Surface chemical analysis — Electron spectroscopies — Minimum reporting requirements for peak fitting in X-ray…
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ISO 19668:2017
Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements…
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ISO 19318:2021
Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of methods used for charge control…