{"id":14433,"date":"2024-10-16T21:36:56","date_gmt":"2024-10-16T21:36:56","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/astm-e2530-2006\/"},"modified":"2024-10-24T12:01:06","modified_gmt":"2024-10-24T12:01:06","slug":"astm-e2530-2006","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/astm\/astm-e2530-2006\/","title":{"rendered":"ASTM-E2530 2006"},"content":{"rendered":"<\/p>\n

1.1 This practice covers a measurement procedure to calibrate the z-scale of an atomic force microscope using Si(111) monatomic step height specimens.<\/p>\n

1.2 Applications This procedure is applicable either in ambient or vacuum condition when the atomic force microscope (AFM) is operated at its highest levels of z-magnification, that is, in the nanometer and sub-nanometer ranges of z-displacement. These ranges of measurement are required when the AFM is used to measure the surfaces of semiconductors, optical surfaces, and other high technology components.<\/p>\n

1.3 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only.<\/p>\n

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nScope
Referenced Documents
Terminology
Significance and Use
Calibration Specimen <\/td>\n<\/tr>\n
2<\/td>\nApparatus
Procedure
Report
FIG. 1 <\/td>\n<\/tr>\n
3<\/td>\nFIG. 2
FIG. 3 <\/td>\n<\/tr>\n
4<\/td>\nUncertainty
Potential Alternative
Keywords
A1. PROCEDURE FOR FABRICATION OF SI(111) MONATOMIC STEP HEIGHT SPECIMENS
A1.1
FIG. A1.1 <\/td>\n<\/tr>\n
5<\/td>\nA1.2
A1.3 Thermal Technique
A1.4 Wet-Chemical Etching <\/td>\n<\/tr>\n
6<\/td>\nREFERENCES
FIG. A1.2 <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

E2530-06 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
ASTM<\/b><\/a><\/td>\n2006<\/td>\n6<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":14434,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[1001,2637],"product_tag":[],"class_list":{"0":"post-14433","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-71-040-50","7":"product_cat-astm","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/14433","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/14434"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=14433"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=14433"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=14433"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}