IEC 62493:2015 applies to the assessment of lighting equipment related to human exposure to electromagnetic fields. The assessment consists of the induced internal electric field for frequencies from 20 kHz to 10 MHz and the specific absorption rate (SAR) for frequencies from 100 kHz to 300 MHz around lighting equipment. This second edition cancels and replaces the first edition published in 2009. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) identification of lighting product types deemed to comply with the standard without the need for test; b) deletion of the need for CISPR-15-compliance as a prerequisite for IEC 62493 compliance; c) inclusion of the consequences of the ICNIPR 2010 guidelines for (up to 100 kHz); d) adding some guidance to the Van der Hoofden test head method to improve reproducibility of results; e) inclusion of compliance demonstration method for products having intentional radiators.<\/p>\n
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| 89<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
| 93<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 95<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
| 96<\/td>\n | 1 Scope 2 Normative references <\/td>\n<\/tr>\n | ||||||
| 97<\/td>\n | 3 Terms, definitions, physical quantities, units and abbreviations 3.1 Terms and definitions <\/td>\n<\/tr>\n | ||||||
| 99<\/td>\n | 3.2 Physical quantities and units <\/td>\n<\/tr>\n | ||||||
| 100<\/td>\n | 3.3 Abbreviations 4 Limits 4.1 General Tables Table 1 \u2013 Physical quantities and units <\/td>\n<\/tr>\n | ||||||
| 101<\/td>\n | 4.2 Unintentional radiating part of lighting equipment 4.2.1 General 4.2.2 Lighting equipment deemed to comply with the Van der Hoofden test without testing 4.2.3 Application of limits 4.3 Intentional radiating part of lighting equipment <\/td>\n<\/tr>\n | ||||||
| 102<\/td>\n | 5 General requirements Van der Hoofden test 5.1 Measurand 5.2 Supply voltage and frequency Figures Figure 1 \u2013 Compliance routes and pass\/fail criteria for lighting equipment <\/td>\n<\/tr>\n | ||||||
| 103<\/td>\n | 5.3 Measurement frequency range 5.4 Ambient temperature 5.5 Measurement equipment requirements Figure 2 \u2013 The Van der Hoofden test head Table 2 \u2013 Receiver or spectrum analyser settings <\/td>\n<\/tr>\n | ||||||
| 104<\/td>\n | 5.6 Measurement instrumentation uncertainty 5.7 Test report Figure 3 \u2013 Example of a protection circuit <\/td>\n<\/tr>\n | ||||||
| 105<\/td>\n | 5.8 Evaluation of results 6 Measurement procedure for the Van der Hoofden test 6.1 General 6.2 Operating conditions 6.2.1 Operating conditions for lighting equipment 6.2.2 Operating conditions for specific lighting equipment <\/td>\n<\/tr>\n | ||||||
| 106<\/td>\n | 6.2.3 Operating conditions for lighting equipment with intentional radiators 6.3 Measurement distance 6.4 Measurement set-up 6.4.1 General Figure 4 \u2013 Measurement set-up <\/td>\n<\/tr>\n | ||||||
| 107<\/td>\n | 6.4.2 Measurement set-up for specific lighting equipment 6.5 Location of measurement test head 6.6 Calculation of the results 7 Assessment procedure intentional radiators 7.1 General 7.2 Low-power exclusion method 7.2.1 General <\/td>\n<\/tr>\n | ||||||
| 108<\/td>\n | 7.2.2 Determination of the total radiated power 7.2.3 Determination of the low-power exclusion level 7.2.4 Summation of multiple transmitters 7.3 Application of the EMF product standard for body worn-equipment 7.4 Application of the EMF product standard for base stations 7.5 Application of another EMF standard <\/td>\n<\/tr>\n | ||||||
| 109<\/td>\n | Figure 5 \u2013 Compliance demonstration procedure for the intentional-transmitter part of the lighting equipment <\/td>\n<\/tr>\n | ||||||
| 110<\/td>\n | Annexes Annex A (normative) Measurement distances <\/td>\n<\/tr>\n | ||||||
| 111<\/td>\n | Annex B (informative) Location of measurement test head Figure B.1 \u2013 Location of measurement point in the transverse direction of lighting equipment \u2013 side view Figure B.2 \u2013 Location of measurement points in the longitude direction of lighting equipment \u2013 side view <\/td>\n<\/tr>\n | ||||||
| 112<\/td>\n | Figure B.3 \u2013 Location of measurement points in the longitude direction of lighting equipment; in the direction of illumination Figure B.4 \u2013 Location of measurement point for lighting equipment with rotationally symmetrical dimensions <\/td>\n<\/tr>\n | ||||||
| 113<\/td>\n | Figure B.5 \u2013 Location of measurement point for lighting equipment with rotationally symmetrical dimensions; in the direction of illumination Figure B.6 \u2013 Location of measurement point for lighting equipment with the same dimensions in the x- and y- axis Table A.1 \u2013 Lighting equipment and measurement distances <\/td>\n<\/tr>\n | ||||||
| 114<\/td>\n | Figure B.7 \u2013 Location of measurement point(s) for lighting equipment with single capped lamp (360\u00b0 illumination) Figure B.8 \u2013 Location of measurement points for lighting equipment with a remote controlgear <\/td>\n<\/tr>\n | ||||||
| 115<\/td>\n | Figure B.9 \u2013 Location of measurement point for an independent electronic converter Figure B.10 \u2013 Location of measurement point(s) for an uplighter (floor standing\/suspended) <\/td>\n<\/tr>\n | ||||||
| 116<\/td>\n | Annex C (informative) Exposure limits C.1 General C.2 ICNIRP C.2.1 ICNIRP 1998 C.2.2 ICNIRP 2010 C.3 IEEE Table C.1 \u2013 Basic restrictions for general public exposure to time varying electric and magnetic fields for frequencies between 100 kHz and 10 GHz Table C.2 \u2013 Basic restrictions for general public exposure to time varying electric and magnetic fields for frequencies up to 10 MHz <\/td>\n<\/tr>\n | ||||||
| 117<\/td>\n | Table C.3 \u2013 IEEE basic restrictions (BR) for the general public Table C.4 \u2013 IEEE basic restrictions (BR) between 100\u00a0kHz and 3\u00a0GHz for the general public <\/td>\n<\/tr>\n | ||||||
| 118<\/td>\n | Annex D (informative) Rationale measurement and assessment method D.1 General D.2 Induced internal electric field D.2.1 General Figure D.1 \u2013 Overview measurement and assessment method <\/td>\n<\/tr>\n | ||||||
| 120<\/td>\n | D.2.2 Induced electric field due to the magnetic field; Eeddy(fi,dloop) Figure D.2 \u2013 Distances of the head, loop and measurement set-up <\/td>\n<\/tr>\n | ||||||
| 121<\/td>\n | Table D.1 \u2013 Induced internal electric field calculations <\/td>\n<\/tr>\n | ||||||
| 122<\/td>\n | Figure D.3 \u2013 Maximum current in the 2 m LLA as function of the frequency <\/td>\n<\/tr>\n | ||||||
| 124<\/td>\n | Figure D.4 \u2013 Induced internal electric field and associated limit levels <\/td>\n<\/tr>\n | ||||||
| 125<\/td>\n | D.2.3 Induced electric field due to the electric field; Ecap(fi,d) Figure D.5 \u2013 Example of magnetic-field test result using the LLA <\/td>\n<\/tr>\n | ||||||
| 126<\/td>\n | Figure D.6 \u2013 Distances of the head and measurement set-up Figure D.7 \u2013 Plot of Equation (D.20) <\/td>\n<\/tr>\n | ||||||
| 127<\/td>\n | Table D.2 \u2013 Calculation main contributions <\/td>\n<\/tr>\n | ||||||
| 128<\/td>\n | D.3 Thermal effects from 100\u00a0kHz to 300\u00a0GHz D.3.1 General Table D.3 \u2013 Frequency steps for the amplitude addition that equals 1,11 times B6 <\/td>\n<\/tr>\n | ||||||
| 129<\/td>\n | D.3.2 The 100\u00a0kHz to 30\u00a0MHz contribution to the thermal effects Table D.4 \u2013 Frequency steps for the power addition that equals 0,833 times B6 <\/td>\n<\/tr>\n | ||||||
| 130<\/td>\n | D.3.3 The 30\u00a0MHz to 300\u00a0MHz contribution to the thermal effects Figure D.8 \u2013 Example of the CM-current measured using a conducted emission test Table D.5 \u2013 Field strength limits according to CISPR 15 <\/td>\n<\/tr>\n | ||||||
| 131<\/td>\n | D.3.4 Overall conclusion for the contribution to thermal effects <\/td>\n<\/tr>\n | ||||||
| 132<\/td>\n | Annex E (normative) Practical internal electric-field measurement and assessment method E.1 Measurement of induced internal electric field E.2 Calculation program <\/td>\n<\/tr>\n | ||||||
| 133<\/td>\n | E.3 Compliance criterion for the Van der Hoofden head test Table E.1 \u2013 Conductivity as a function of frequency (see Table C.1 of IEC\u00a062311:2007) <\/td>\n<\/tr>\n | ||||||
| 134<\/td>\n | Annex F (normative) Protection network F.1 Calibration of the protection network Figure F.1 \u2013 Test set-up for normalization of the network analyser <\/td>\n<\/tr>\n | ||||||
| 135<\/td>\n | F.2 Calculation of the theoretical characteristic of the protection network Figure F.2 \u2013 Test set-up for measurement of the voltage division factor using a network analyser <\/td>\n<\/tr>\n | ||||||
| 136<\/td>\n | Figure F.3 \u2013 Calculated theoretical characteristic for the calibration of the protection network <\/td>\n<\/tr>\n | ||||||
| 137<\/td>\n | Annex G (informative) Measurement instrumentation uncertainty Table G.1 \u2013 Uncertainty calculation for the measurement method described in Clauses 5 and 6 in the frequency range from 20\u00a0kHz to 10\u00a0MHz <\/td>\n<\/tr>\n | ||||||
| 138<\/td>\n | Table G.2 \u2013 Comments and information to Table G.1 <\/td>\n<\/tr>\n | ||||||
| 139<\/td>\n | Annex H (informative) Equipment deemed to comply <\/td>\n<\/tr>\n | ||||||
| 140<\/td>\n | Figure H.1 \u2013 Flow chart to determine applicability deemed to comply without F factor measurement <\/td>\n<\/tr>\n | ||||||
| 141<\/td>\n | Annex I (informative) Intentional radiators I.1 General I.2 Intentional radiators in lighting equipment I.3 Properties of antennas in lighting applications <\/td>\n<\/tr>\n | ||||||
| 142<\/td>\n | Table I.1 \u2013 Overview of wireless radio technologies that might be applied in lighting systems <\/td>\n<\/tr>\n | ||||||
| 143<\/td>\n | Figure I.1 \u2013 Luminaire with a transmitting antenna in a room <\/td>\n<\/tr>\n | ||||||
| 144<\/td>\n | Figure I.2 \u2013 Impact of a conducting ceiling\/plane <\/td>\n<\/tr>\n | ||||||
| 145<\/td>\n | Figure I.3 \u2013 Electric field of a small electrical dipole: analytical formula vs far-field approximation <\/td>\n<\/tr>\n | ||||||
| 146<\/td>\n | Figure I.4 \u2013 Electric field as a function of distance, antenna gain and input power (far-field approximation) <\/td>\n<\/tr>\n | ||||||
| 147<\/td>\n | I.4 Exposure assessment approach I.4.1 General I.4.2 Determination of average total radiated power Pint,rad Figure I.5 \u2013 Impact of pulsed signals on the average exposure <\/td>\n<\/tr>\n | ||||||
| 148<\/td>\n | I.4.3 Determination of the low-power exclusion level Pmax I.5 Multiple transmitters in a luminaire <\/td>\n<\/tr>\n | ||||||
| 149<\/td>\n | I.6 Exposure to multiple luminaires I.7 References in Annex I <\/td>\n<\/tr>\n | ||||||
| 151<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Tracked Changes. Assessment of lighting equipment related to human exposure to electromagnetic field<\/b><\/p>\n |