{"id":231964,"date":"2024-10-19T15:06:48","date_gmt":"2024-10-19T15:06:48","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-pd-cen-iso-ts-17444-22017-tc\/"},"modified":"2024-10-25T09:29:15","modified_gmt":"2024-10-25T09:29:15","slug":"bsi-pd-cen-iso-ts-17444-22017-tc","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-pd-cen-iso-ts-17444-22017-tc\/","title":{"rendered":"BSI PD CEN\/ISO TS 17444-2:2017 – TC"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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134<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
136<\/td>\n | European foreword Endorsement notice <\/td>\n<\/tr>\n | ||||||
140<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
141<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
144<\/td>\n | 1 Scope 2 Normative references <\/td>\n<\/tr>\n | ||||||
145<\/td>\n | 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
149<\/td>\n | 4 Symbols and abbreviated terms <\/td>\n<\/tr>\n | ||||||
150<\/td>\n | 5 Examination Framework 5.1 General <\/td>\n<\/tr>\n | ||||||
151<\/td>\n | 5.2 Method for defining a Specific Examination Framework 5.2.1 General <\/td>\n<\/tr>\n | ||||||
152<\/td>\n | 5.2.2 Selection of metrics to be evaluated 5.2.3 Definition of environmental conditions and associated performance requirements 5.2.4 Determination of Required Sample Sizes <\/td>\n<\/tr>\n | ||||||
153<\/td>\n | 5.2.5 Selection of methods for generating Charging Input and Reference Data 5.2.6 Determination of Test Routes\/Subset of Charged Network for generating representative trips 5.2.7 Documentation of the Specific Examination Framework 5.3 Sources of data <\/td>\n<\/tr>\n | ||||||
156<\/td>\n | 5.4 Methods of generating charging input 5.4.1 General <\/td>\n<\/tr>\n | ||||||
157<\/td>\n | 5.4.2 Predefined routes (identifier: \u201cPVP\u201d) <\/td>\n<\/tr>\n | ||||||
158<\/td>\n | 5.4.3 Reference System (used in combination with identifiers: \u201cPVR\u201d and \u201cUVR\u201d) <\/td>\n<\/tr>\n | ||||||
159<\/td>\n | 5.4.4 Simulated OBE\/FE (identifier: \u201cSO\u201d) <\/td>\n<\/tr>\n | ||||||
160<\/td>\n | 5.4.5 Dedicated OBE Testing (identifier: \u201cDO\u201d) 5.5 Applicability of metrics scheme types <\/td>\n<\/tr>\n | ||||||
165<\/td>\n | 5.6 Charging Metric Selection Tables 5.6.1 General 5.6.2 DSRC Discrete <\/td>\n<\/tr>\n | ||||||
166<\/td>\n | 5.6.3 Autonomous Discrete <\/td>\n<\/tr>\n | ||||||
167<\/td>\n | 5.6.4 Autonomous Continuous <\/td>\n<\/tr>\n | ||||||
169<\/td>\n | 6 Examination Tests 6.1 Common (and DSRC Discrete) Examination Tests 6.1.1 General 6.1.2 ET-CM-E2E-1 E2E \u2014 Correct Charging Rate <\/td>\n<\/tr>\n | ||||||
170<\/td>\n | 6.1.3 ET-CM-E2E-2 E2E \u2014 Overcharging Rate 6.1.4 ET-CM-E2E-3 E2E \u2014 Undercharging Rate <\/td>\n<\/tr>\n | ||||||
171<\/td>\n | 6.1.5 ET-CM-E2E-4 E2E \u2014 Late Charging Rate <\/td>\n<\/tr>\n | ||||||
172<\/td>\n | 6.1.6 ET-CM-UA-1 UA \u2014 Correct Charging Rate 6.1.7 ET-CM-UA-2 UA \u2014 Overcharging Rate <\/td>\n<\/tr>\n | ||||||
173<\/td>\n | 6.1.8 ET-CM-UA-3 UA \u2014 Undercharging Rate <\/td>\n<\/tr>\n | ||||||
174<\/td>\n | 6.1.9 ET-CM-UA-4 UA \u2014 Accurate application of Payments and Refunds 6.1.10 ET-CM-UA-5 UA \u2014 Accurate Personalisation of OBUs <\/td>\n<\/tr>\n | ||||||
175<\/td>\n | 6.1.11 ET-CM-PC-1 PC \u2014 Correct Charging Rate 6.1.12 ET-CM-PC-2 PC \u2014 Overcharging Rate <\/td>\n<\/tr>\n | ||||||
176<\/td>\n | 6.1.13 ET-CM-PC-3 PC \u2014 Undercharging Rate <\/td>\n<\/tr>\n | ||||||
177<\/td>\n | 6.1.14 ET-CM-PC-4 PC \u2014 Latency \u2014 TC 6.1.15 ET-CM-PC-5 PC \u2014 Late Payment Claims Rate <\/td>\n<\/tr>\n | ||||||
178<\/td>\n | 6.1.16 ET-CM-PC-6 PC \u2014 Rejected Payment Claim Rate 6.1.17 ET-CM-BD-1 BD \u2014 Correct Charging Rate <\/td>\n<\/tr>\n | ||||||
179<\/td>\n | 6.1.18 ET-CM-BD-2 BD \u2014 Overcharging Rate <\/td>\n<\/tr>\n | ||||||
180<\/td>\n | 6.1.19 ET-CM-BD-3 BD \u2014 Undercharging Rate 6.1.20 ET-CM-BD-4 BD \u2014 Incorrect Charging Rate <\/td>\n<\/tr>\n | ||||||
181<\/td>\n | 6.1.21 ET-CM-BD-5 BD \u2014 Latency \u2014 TC 6.1.22 ET-CM-BD-6 BD \u2014 Late Billing Details Rate <\/td>\n<\/tr>\n | ||||||
182<\/td>\n | 6.1.23 ET-CM-BD-7 BD \u2014 Rejected Billing Details Rate 6.1.24 ET-CM-BD-8 BD \u2014 Incorrectly rejected Billing Details Rate <\/td>\n<\/tr>\n | ||||||
183<\/td>\n | 6.1.25 ET-CM-BD-9 BD \u2014 Inferred Billing Details Rate 6.2 DSRC Discrete \u2014 Optional DSRC Toll Declaration Metrics 6.2.1 General 6.2.2 ET-CM-TD-1 TD \u2014 Correct Toll Declaration Generation Rate <\/td>\n<\/tr>\n | ||||||
184<\/td>\n | 6.2.3 ET-CM-TD-2 TD \u2014 Incorrect Toll Declaration Generation Rate 6.2.4 ET-CM-TD-3 TD \u2014 Late Toll Declarations Rate <\/td>\n<\/tr>\n | ||||||
185<\/td>\n | 6.2.5 ET-CM-TD-4 TD \u2014 TSP Charge Parameter Change Rate 6.2.6 ET-CM-TD-5 TD \u2014 TSP False Positive Rate <\/td>\n<\/tr>\n | ||||||
186<\/td>\n | 6.3 Autonomous Discrete Specific Examination Tests 6.3.1 General 6.3.2 ET-CM-TD-1 TD \u2014 Correct Toll Declaration Generation Rate 6.3.3 ET-CM-TD-2 TD \u2014 Incorrect Toll Declaration Generation Rate <\/td>\n<\/tr>\n | ||||||
187<\/td>\n | 6.3.4 ET-CM-TD-3 TD \u2014 Late Toll Declarations Rate 6.3.5 ET-CM-TD-4 TD \u2014 TSP Charge Parameter Change Rate <\/td>\n<\/tr>\n | ||||||
188<\/td>\n | 6.3.6 ET-CM-TD-5 TD \u2014 TSP False Positive Rate 6.3.7 ET-CM-DTD-1 DTD \u2014 Correct Charging Rate (charge object detections) <\/td>\n<\/tr>\n | ||||||
189<\/td>\n | 6.3.8 ET-CM-DTD-2 DTD \u2014 Incorrect Charge Event Recognition Rate 6.3.9 ET-CM-DTD-3 DTD \u2014 Missed Charge Object Detection Rate <\/td>\n<\/tr>\n | ||||||
190<\/td>\n | 6.3.10 ET-CM-DTD-4 DTD Overcharging Rate 6.3.11 ET-CM-CR-1 CR \u2014 Correct Charge Report Generation Rate <\/td>\n<\/tr>\n | ||||||
191<\/td>\n | 6.3.12 ET-CM-CR-2 CR \u2014 Incorrect Charge Report Generation Rate 6.3.13 ET-CM-CR-3 CR \u2014 Charge Report Latency <\/td>\n<\/tr>\n | ||||||
192<\/td>\n | 6.3.14 ET-CM-CR-4 CR \u2014 TSP Front End Charge Parameter Change Rate 6.3.15 ET-CM-CR-5 CR \u2014 TSP Front End False Positive Rate <\/td>\n<\/tr>\n | ||||||
193<\/td>\n | 6.3.16 ET-CM-DCR-1 DCR \u2014 Correct Charging Rate (charge object detections) 6.3.17 ET-CM-DCR-2 DCR \u2014 Incorrect Charge Event Recognition Rate <\/td>\n<\/tr>\n | ||||||
194<\/td>\n | 6.3.18 ET-CM-DCR-3 DCR \u2014 Missed Charge Object Detection Rate 6.3.19 ET-CM-DCR-4 DCR \u2014 Overcharging rate (Incorrect false positive Charge Event Recognition) <\/td>\n<\/tr>\n | ||||||
195<\/td>\n | 6.4 Autonomous Continuous Specific Examination Tests 6.4.1 General 6.4.2 ET-CM-TD-1 TD \u2014 Correct Toll Declaration Generation Rate 6.4.3 ET-CM-TD-2 TD \u2014 Incorrect Toll Declaration Generation Rate <\/td>\n<\/tr>\n | ||||||
196<\/td>\n | 6.4.4 ET-CM-TD-3 TD \u2014 Late Toll Declarations Rate 6.4.5 ET-CM-TD-4 TD \u2014 TSP Charge Parameter Change Rate <\/td>\n<\/tr>\n | ||||||
197<\/td>\n | 6.4.6 ET-CM-TD-5 TD \u2014 TSP False Positive Rate 6.4.7 ET-CM-CTD-1 CTD Correct Charging Rate <\/td>\n<\/tr>\n | ||||||
198<\/td>\n | 6.4.8 ET-CM-CTD-2 CTD Overcharging Rate 6.4.9 ET-CM-CTD-3 CTD Accuracy of Distance\/Time Measurement <\/td>\n<\/tr>\n | ||||||
199<\/td>\n | 6.4.10 ET-CM-CR-1 CR \u2014 Correct Charge Report Generation Rate 6.4.11 ET-CM-CR-2 CR \u2014 Incorrect Charge Report Generation Rate <\/td>\n<\/tr>\n | ||||||
200<\/td>\n | 6.4.12 ET-CM-CR-3 CR \u2014 Charge Report Latency 6.4.13 ET-CM-CR-4 CR \u2014 TSP Front End Charge Parameter Change Rate <\/td>\n<\/tr>\n | ||||||
201<\/td>\n | 6.4.14 ET-CM-CR-5 CR \u2014 TSP Front End False Positive Rate 6.4.15 ET-CM-CCR-1 CCR \u2014 Correct Charging Rate <\/td>\n<\/tr>\n | ||||||
202<\/td>\n | 6.4.16 ET-CM-CCR-2 CCR \u2014 Overcharging Rate 6.4.17 ET-CM-CCR-3 CCR \u2014 Accuracy of Distance\/Time Measurement <\/td>\n<\/tr>\n | ||||||
204<\/td>\n | Annex A (informative) Examination Test documentation template <\/td>\n<\/tr>\n | ||||||
205<\/td>\n | Annex B (informative) Examination Framework considerations <\/td>\n<\/tr>\n | ||||||
209<\/td>\n | Annex C (informative) Statistical considerations <\/td>\n<\/tr>\n | ||||||
215<\/td>\n | Annex D (informative) Methods for reducing sample sizes for very high\/low probability metrics during the Evaluation Phase <\/td>\n<\/tr>\n | ||||||
219<\/td>\n | Annex E (informative) Example-specific Examination Frameworks <\/td>\n<\/tr>\n | ||||||
236<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Tracked Changes. Electronic fee collection. Charging performance – Examination Framework<\/b><\/p>\n |