{"id":374846,"date":"2024-10-20T02:40:41","date_gmt":"2024-10-20T02:40:41","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iec-61967-42021\/"},"modified":"2024-10-26T04:40:07","modified_gmt":"2024-10-26T04:40:07","slug":"bs-en-iec-61967-42021","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iec-61967-42021\/","title":{"rendered":"BS EN IEC 61967-4:2021"},"content":{"rendered":"

IEC 61967-4:2021 is available as IEC 61967-4:2021 RLV<\/span> which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 61967-4:2021 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 ? resistive probe and RF voltage measurement using a 150 ? coupling network. These methods ensure a high degree of reproducibility and correlation of EME measurement results. This edition includes the following significant technical changes with respect to the previous edition: – frequency range of 150 kHz to 1 GHz has been deleted from the title; – recommended frequency range for 1 ? method has been reduced to 30 MHz; – Annex G with recommendations and guidelines for frequency range extension beyond 1 GHz has been added.<\/p>\n

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2<\/td>\nundefined <\/td>\n<\/tr>\n
5<\/td>\nAnnex ZA(normative)Normative references to international publicationswith their corresponding European publications <\/td>\n<\/tr>\n
7<\/td>\nEnglish
CONTENTS <\/td>\n<\/tr>\n
10<\/td>\nFOREWORD <\/td>\n<\/tr>\n
12<\/td>\n1 Scope
2 Normative references
3 Terms and definitions
4 General
4.1 Measurement basics <\/td>\n<\/tr>\n
13<\/td>\nFigures
Figure 1 \u2013 Example of two emitting loops returning to the IC via common ground
Figure 2 \u2013 Example of IC with two ground pins, a small I\/O loop and two emitting loops <\/td>\n<\/tr>\n
14<\/td>\n4.2 RF current measurement
4.3 RF voltage measurement at IC pins
4.4 Assessment of the measurement technique
5 Test conditions <\/td>\n<\/tr>\n
15<\/td>\n6 Test equipment
6.1 RF measuring instrument
6.2 RF current probe specification
Figure 3 \u2013 Construction of the 1 \u2126 RF current probe <\/td>\n<\/tr>\n
16<\/td>\n6.3 Test of the RF current probe capability
6.4 Matching network specification
Tables
Table 1 \u2013 Specification of the RF current probe <\/td>\n<\/tr>\n
17<\/td>\n7 Test setup
7.1 General test configuration
7.2 Printed circuit test board layout
Figure 4 \u2013 Impedance matching network corresponding with IEC 61000-4-6
Figure 5 \u2013 General test configuration
Table 2 \u2013 Characteristics of the impedance matching network <\/td>\n<\/tr>\n
18<\/td>\n8 Test procedure
9 Test report <\/td>\n<\/tr>\n
19<\/td>\nAnnexes
Annex A (informative) Probe verification procedure
Figure A.1 \u2013 Test circuit
Figure A.2 \u2013 Insertion loss of the 1 \u2126 probe <\/td>\n<\/tr>\n
20<\/td>\nFigure A.3 \u2013 Layout of the verification test circuit <\/td>\n<\/tr>\n
21<\/td>\nFigure A.4 \u2013 Connection of the verification test circuit
Figure A.5 \u2013 Minimum decoupling limit versus frequency <\/td>\n<\/tr>\n
22<\/td>\nFigure A.6 \u2013 Example of 1 \u2126 probe input impedance characteristic <\/td>\n<\/tr>\n
23<\/td>\nAnnex B (informative) Classification of conducted emission levels
B.1 Introductory remark
B.2 General
B.3 Definition of emission levels
B.4 Presentation of results
B.4.1 General <\/td>\n<\/tr>\n
24<\/td>\nFigure B.1 \u2013 Emission level scheme <\/td>\n<\/tr>\n
25<\/td>\nB.4.2 Examples
Figure B.2 \u2013 Example of the maximum emission level G8f <\/td>\n<\/tr>\n
26<\/td>\nTable B.1 \u2013 Emission levels <\/td>\n<\/tr>\n
27<\/td>\nAnnex C (informative) Example of reference levels for automotive applications
C.1 Introductory remark
C.2 General
C.3 Reference levels
C.3.1 General <\/td>\n<\/tr>\n
28<\/td>\nC.3.2 Measurements of conducted emissions, 1 \u2126 method
C.3.3 Measurements of conducted emissions, 150 \u2126 method
Figure C.1 \u2013 1 \u2126 method – Examples of reference levels for conducted disturbances from semiconductors (peak detector)
Figure C.2 \u2013 150 \u2126 method – Examples of reference levels for conducted disturbances from semiconductors (peak detector) <\/td>\n<\/tr>\n
29<\/td>\nAnnex D (informative) EMC requirements and how to use EMC IC measurement techniques
D.1 Introductory remark
D.2 Using EMC measurement procedures
D.3 Assessment of the IC influence to the EMC behaviour of the modules
Table D.1 \u2013 Examples in which the measurement procedure can be reduced <\/td>\n<\/tr>\n
30<\/td>\nTable D.2 \u2013 System- and module-related ambient parameters
Table D.3 \u2013 Changes at the IC which influence the EMC <\/td>\n<\/tr>\n
31<\/td>\nAnnex E (informative) Example of a test setup consisting of an EMC main test board and an EME IC test board
E.1 Introductory remark
E.2 EMC main test board <\/td>\n<\/tr>\n
32<\/td>\nFigure E.1 \u2013 EMC main test board
Figure E.2 \u2013 Jumper field <\/td>\n<\/tr>\n
33<\/td>\nE.3 EME IC test board
E.3.1 General explanation of the test board
E.3.2 How to build the test system
Figure E.3 \u2013 EME IC test board (contact areas for the spring connector pins of the main test board) <\/td>\n<\/tr>\n
34<\/td>\nFigure E.4 \u2013 Example of an EME IC test system <\/td>\n<\/tr>\n
35<\/td>\nE.3.3 PCB layout and component positioning
Figure E.5 \u2013 Component side of the EME IC test board <\/td>\n<\/tr>\n
36<\/td>\nFigure E.6 \u2013 Bottom side of the EME IC test board <\/td>\n<\/tr>\n
37<\/td>\nAnnex F (informative) 150 \u2126 direct coupling networks for common mode emission measurements of differential mode data transfer ICs and similar circuits
F.1 Basic direct coupling network
Figure F.1 \u2013 Basic direct coupling for common mode EMC measurements <\/td>\n<\/tr>\n
38<\/td>\nF.2 Example of a common-mode coupling network alternative for LVDS or RS485 or similar systems
Figure F.2 \u2013 Measurement setup for the S21 measurement of the common-mode coupling
Figure F.3 \u2013 Using split load termination as coupling for measuring equipment <\/td>\n<\/tr>\n
39<\/td>\nF.3 Example of a common-mode coupling network alternative for differential IC outputs to resistive loads (e.g. airbag ignition driver)
F.4 Example of a common-mode coupling network for CAN systems
Figure F.4 \u2013 Using split load termination as coupling for measuring equipment
Figure F.5 \u2013 Example of an acceptable adaptation for special network requirements (e.g. for CAN systems) <\/td>\n<\/tr>\n
40<\/td>\nAnnex G (informative) Measurement of conducted emissions in extended frequency range
G.1 General
G.2 Guidelines
G.2.1 Measurement network <\/td>\n<\/tr>\n
41<\/td>\nG.2.2 Network components
Figure G.1 \u2013 Example of a 150 \u2126 measurement network <\/td>\n<\/tr>\n
42<\/td>\nFigure G.2 \u2013 Example of RF characteristic of network components <\/td>\n<\/tr>\n
43<\/td>\nG.2.3 Network layout
G.2.4 Network verification <\/td>\n<\/tr>\n
44<\/td>\nG.2.5 Test board
Figure G.3 \u2013 Examples of S21 characteristic by simulation <\/td>\n<\/tr>\n
45<\/td>\nFigure G.4 \u2013 Examples of test board section
Figure G.5 \u2013 Examples of unwanted cross coupling between measurement network and traces on test PCB
Figure G.6 \u2013 Examples of unwanted signal line cross coupling on S21 transfer characteristic of RF measurement network <\/td>\n<\/tr>\n
46<\/td>\nG.3 Application area
Figure G.7 \u2013 Examples of test board with additional signal line connected to IC pin
Figure G.8 \u2013 Examples of stub lines length effects on S21 transfer characteristic of RF measurement network <\/td>\n<\/tr>\n
47<\/td>\nTable G.1 \u2013 Draft selection table for conducted emission measurements at pins above 1 GHz <\/td>\n<\/tr>\n
48<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Integrated circuits. Measurement of electromagnetic emissions – Measurement of conducted emissions. 1 \u03a9\/150 \u03a9 direct coupling method<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2021<\/td>\n50<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":374855,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2641],"product_tag":[],"class_list":{"0":"post-374846","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-bsi","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/374846","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/374855"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=374846"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=374846"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=374846"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}