{"id":398030,"date":"2024-10-20T04:33:32","date_gmt":"2024-10-20T04:33:32","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-c62-39-2012\/"},"modified":"2024-10-26T08:21:45","modified_gmt":"2024-10-26T08:21:45","slug":"ieee-c62-39-2012","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-c62-39-2012\/","title":{"rendered":"IEEE C62.39-2012"},"content":{"rendered":"
New IEEE Standard – Active. The basic requirements to be met by series connected, solid-state, self-restoring overcurrent protectors (OCPs) for the protection of telecommunication equipment and lines are presented. This standard should be used for the harmonization of existing or future specifications issued by solid-state, self-restoring OCP manufacturers, telecommunication equipment manufacturers, administrations, or network operators.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
1<\/td>\n | IEEE Std C62.39-2012 Front cover \n <\/td>\n<\/tr>\n | ||||||
3<\/td>\n | Title page \n <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | Notice to users Laws and regulations Copyrights Updating of IEEE documents Errata Patents <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | Participants <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | Contents <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | Important notice \n 1. Overview 1.1 Scope <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 1.2 Purpose 2. Definitions and acronyms 2.1 Definitions <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 2.2 Acronyms 3. Graphical symbols <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 4. Storage conditions 5. Overcurrent protector electrical parameters 5.1 Test methods <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 5.2 Electrical requirements 6. Characteristic parameters 6.1 Resistance, R <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 6.2 Hold current, Ih <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 6.3 Trip current, It <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 7. Technology-specific characteristics 7.1 Time-to-trip, ttrip (PTC thermistor) <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 7.2 Resistance 1 h after tripping, R1 for PPTC thermistors <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 7.3 Reset voltage, Vreset for ECL <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | 7.4 Impulse resistance, Rimp, for ceramic PTC thermistors <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | 8. Rated values 8.1 Impulse voltage withstand <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | 8.2 AC power fault\u2014power induction tests <\/td>\n<\/tr>\n | ||||||
30<\/td>\n | 8.3 AC power fault\u2014power contact tests <\/td>\n<\/tr>\n | ||||||
31<\/td>\n | 8.4 Impulse endurance test (life test) <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | 8.5 AC endurance test (life test) <\/td>\n<\/tr>\n | ||||||
33<\/td>\n | 9. Informative characteristics 9.1 Hold current variation with temperature 9.2 Trip-time variation with fault current value for PTC thermistor OCPs <\/td>\n<\/tr>\n | ||||||
34<\/td>\n | 9.3 Resistance recovery after a trip event for PPTC thermistor OCPs <\/td>\n<\/tr>\n | ||||||
35<\/td>\n | Annex A (informative) \nBibliography <\/td>\n<\/tr>\n | ||||||
36<\/td>\n | Annex B (informative) \nAcknowledgement <\/td>\n<\/tr>\n | ||||||
37<\/td>\n | Annex C (informative) \nPower fault C.1 Introduction C.2 Hazards C.3 Wiring simulator <\/td>\n<\/tr>\n | ||||||
38<\/td>\n | C.4 Power contact <\/td>\n<\/tr>\n | ||||||
39<\/td>\n | C.5 Power induction <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Standard for Test Methods and Preferred Values for Self-Restoring Current-Limiter Components Used in Telecommunication Surge Protection<\/b><\/p>\n |