{"id":408861,"date":"2024-10-20T05:32:49","date_gmt":"2024-10-20T05:32:49","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iec-63275-12022\/"},"modified":"2024-10-26T10:08:12","modified_gmt":"2024-10-26T10:08:12","slug":"bs-iec-63275-12022","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iec-63275-12022\/","title":{"rendered":"BS IEC 63275-1:2022"},"content":{"rendered":"

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
2<\/td>\nundefined <\/td>\n<\/tr>\n
4<\/td>\nEnglish
CONTENTS <\/td>\n<\/tr>\n
5<\/td>\nFOREWORD <\/td>\n<\/tr>\n
7<\/td>\nINTRODUCTION <\/td>\n<\/tr>\n
8<\/td>\n1 Scope
2 Normative references
3 Terms and definitions
4 Requirements
4.1 Sample
4.2 Test temperature
4.3 Test voltage <\/td>\n<\/tr>\n
9<\/td>\n4.4 Test time
4.5 Measurement temperature
4.6 Failure criteria
4.7 Test circuit
5 Procedures
5.1 Sequence of procedure
Figures
Figure 1 \u2013 Circuit diagram for bias temperature instability test <\/td>\n<\/tr>\n
10<\/td>\n5.2 Select sample
5.3 VGS(th) measurement methods
Figure 2 \u2013 Test flow chart <\/td>\n<\/tr>\n
11<\/td>\nFigure 3 \u2013 Schematic of test pattern for Example 1
Figure 4 \u2013 IDS versus VGS curve for Example 1 <\/td>\n<\/tr>\n
12<\/td>\nFigure 5 \u2013 Schematic of test pattern for Example 2 and Example 3
Figure 6 \u2013 IDS versus VGS curve for Example 2
Figure 7 \u2013 IDS \u2013 VGS curve for Example 3 <\/td>\n<\/tr>\n
13<\/td>\n5.4 How to provide a reproducible measurement of VGS(th)
5.5 Initial measurement
Figure 8 \u2013 Schematic of test pattern for Example 4 <\/td>\n<\/tr>\n
14<\/td>\n5.6 Apply voltage and temperature stress
5.7 Remove voltage and temperature stress
5.8 Intermediate measurement
6 Test report <\/td>\n<\/tr>\n
15<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors – Test method for bias temperature instability<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2022<\/td>\n16<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":408866,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[576,2641],"product_tag":[],"class_list":{"0":"post-408861","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-31-080-30","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/408861","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/408866"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=408861"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=408861"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=408861"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}