| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
| 4<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
| 6<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 8<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
| 9<\/td>\n | 1 Scope 2 Normative references 3 Terms, definitions, and abbreviated terms 3.1 Terms and definitions <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | 3.2 Abbreviated terms 4 Measurement of mass density of vertically-aligned carbon nanotubes with Xray absorption method 4.1 General 4.2 Measurement principle Figures Figure 1 \u2013 Measurement principle of X-ray absorption method <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | 4.3 Description of measurement equipment and apparatus 4.4 Sample preparation 4.5 Thickness measurement with X-ray absorption method Figure 2 \u2013 Parameters determining the spatial resolution of X-ray absorption method <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 4.6 Density measurement with X-ray absorption method Figure 3 \u2013 Example of X-ray projection image of VACNTs grown on Si substrate Figure 4 \u2013 Example of transmitted X-ray intensity profile for VACNT sample <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 5 Appropriate data formats Figure 5 \u2013 Example of calibration result for non-monochromatic incident X-ray <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | Tables Table 1 \u2013 Possible data format to be given together withdensity of VACNTs obtained with X-ray absorption method <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | Annex A (informative)Case study of mass density measurements forvertically-aligned carbon nanotubes A.1 Overview A.2 Sample preparation for VACNTs A.3 Confirmation of X-ray incidence parallel to the substrate surface <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | A.4 Thickness and mass density measurements with transmitted X-ray intensity profiles Figure A.1 \u2013 Schematic drawings of beam alignment proceduresfor X-ray absorption measurement <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | Figure A.2 \u2013 X-ray projection images and transmitted X-rayintensity profiles observed for two VACNT samples <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | A.5 Measurement results for a VACNT film with a thickness of several hundred micrometres Figure A.3 \u2013 Cross-sectional scanning electron microscopeimages of two VACNT samples Table A.1 \u2013 Parameters obtained from the transmittedX-ray intensity profiles for two VACNT samples <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | Figure A.4 \u2013 X-ray projection image and transmitted X-rayintensity profile observed for a thicker VACNT film Figure A.5 \u2013 Cross-sectional scanning electron microscopeimage of a thicker VACNT film Table A.2 \u2013 Parameters obtained from the transmitted X-rayintensity profile for a thicker VACNT film <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | A.6 Measurement results for a VACNT film with a thickness of several millimetres <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | Figure A.6 \u2013 X-ray projection image and transmitted X-ray intensityprofile observed for a millimetre-thick VACNT film Figure A.7 \u2013 X-ray projection image and mass densityprofile observed for a millimetre-thick VACNT film <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Nanomanufacturing. Key control characteristics – Carbon nanotube materials. Mass density of vertically-aligned carbon nanotubes: X-ray absorption method<\/b><\/p>\n |