{"id":81007,"date":"2024-10-17T18:50:19","date_gmt":"2024-10-17T18:50:19","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-c62-45-2003\/"},"modified":"2024-10-24T19:45:25","modified_gmt":"2024-10-24T19:45:25","slug":"ieee-c62-45-2003","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-c62-45-2003\/","title":{"rendered":"IEEE C62.45 2003"},"content":{"rendered":"

Revision Standard – Active. The scope of this recommended practice is the performance of surge testing on electrical and electronic equipment connected to low-voltage ac power circuits, specifically using there commended test waveforms defined in IEEE Std C62.41.2TM-2002. Nevertheless, these recommendations are applicable to any surge testing, regardless of the specific surges that may be applied. This IEEE standards product is part C62 Family on Surge Protection.<\/p>\n

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PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nIEEE Std C62.45-2002 Cover Page <\/td>\n<\/tr>\n
2<\/td>\nTitle Page <\/td>\n<\/tr>\n
3<\/td>\nAbstract\/Keywords <\/td>\n<\/tr>\n
5<\/td>\nIntroduction
CAUTION
Participants <\/td>\n<\/tr>\n
8<\/td>\nCONTENTS <\/td>\n<\/tr>\n
10<\/td>\n1. Overview
1.1 Scope <\/td>\n<\/tr>\n
11<\/td>\n1.2 Purpose <\/td>\n<\/tr>\n
12<\/td>\n2. References <\/td>\n<\/tr>\n
13<\/td>\n3. Definitions
3.1 Technical terms
3.2 Special word usage <\/td>\n<\/tr>\n
14<\/td>\n4. Planning of surge testing: Basic objectives
4.1 General
4.2 Surge environment <\/td>\n<\/tr>\n
15<\/td>\n4.3 Types of tests
4.4 Results and consequences of the test <\/td>\n<\/tr>\n
16<\/td>\n4.5 Unpowered testing versus powered testing <\/td>\n<\/tr>\n
17<\/td>\n4.6 Withstand levels
4.7 Voltage and current waveforms <\/td>\n<\/tr>\n
19<\/td>\n4.8 Safety
5. Implementation of surge testing: Test equipment
5.1 General
5.2 Surge generators <\/td>\n<\/tr>\n
20<\/td>\n5.3 Point of test surge application
5.4 Coupling the surge to the EUT <\/td>\n<\/tr>\n
22<\/td>\n5.5 Monitoring the EUT <\/td>\n<\/tr>\n
24<\/td>\n6. Performance of surge testing: Test procedures
6.1 General
6.2 Limiting stresses
6.3 Nature of the EUT <\/td>\n<\/tr>\n
25<\/td>\n6.4 Safety <\/td>\n<\/tr>\n
26<\/td>\n7. Applying the test surge: Coupling and decoupling circuits
7.1 General
7.2 Requirements for surge coupling <\/td>\n<\/tr>\n
28<\/td>\n7.3 Impedance considerations
7.4 Requirements for surge decoupling <\/td>\n<\/tr>\n
29<\/td>\n7.5 Surge coupling <\/td>\n<\/tr>\n
33<\/td>\n8. Grounding
8.1 Grounding precautions <\/td>\n<\/tr>\n
35<\/td>\n8.2 Grounding practices in EUTs
9. Standard surge tests waveforms
9.1 General <\/td>\n<\/tr>\n
36<\/td>\n9.2 Standard waveforms <\/td>\n<\/tr>\n
40<\/td>\n9.3 Test procedures <\/td>\n<\/tr>\n
41<\/td>\n9.4 Equations for standard waveforms <\/td>\n<\/tr>\n
43<\/td>\n10. Additional surge test waveforms
10.1 General
10.2 Additional waveforms <\/td>\n<\/tr>\n
49<\/td>\n10.3 Equations for additional waveforms
11. Evaluating test results <\/td>\n<\/tr>\n
51<\/td>\nAnnex A (informative) SPD Class I test parameters
A.1 General
A.2 The IEC Class I test for SPDs
A.3 Parameters for a 10\/350 \u00b5s waveform <\/td>\n<\/tr>\n
53<\/td>\nAnnex B (informative) Complementary notes
B.1 AC power interface (ac power port) <\/td>\n<\/tr>\n
54<\/td>\nB.2 Average power (overstressing)
B.3 Back filter
B.4 Blind spots <\/td>\n<\/tr>\n
55<\/td>\nB.5 Common mode (and normal mode) <\/td>\n<\/tr>\n
57<\/td>\nB.6 Communications interface (control\/signal port) <\/td>\n<\/tr>\n
58<\/td>\nB.7 Coupler
B.8 Coupling gap
B.9 Current surging <\/td>\n<\/tr>\n
59<\/td>\nB.10 Current transformers <\/td>\n<\/tr>\n
60<\/td>\nB.11 Damage
B.12 Design test <\/td>\n<\/tr>\n
61<\/td>\nB.13 Diagnostic test
B.14 Differential connection <\/td>\n<\/tr>\n
62<\/td>\nB.15 Effective output impedance <\/td>\n<\/tr>\n
64<\/td>\nB.16 Environment test versus component specification test <\/td>\n<\/tr>\n
65<\/td>\nB.17 Equipment grounding conductor <\/td>\n<\/tr>\n
66<\/td>\nB.18 Equipment under test (EUT)
B.19 Fault current <\/td>\n<\/tr>\n
68<\/td>\nB.20 Follow current
B.21 Ground fault protection <\/td>\n<\/tr>\n
69<\/td>\nB.22 Grounding conductor
B.23 Grounding practices <\/td>\n<\/tr>\n
70<\/td>\nB.24 Insulation coordination <\/td>\n<\/tr>\n
72<\/td>\nB.25 Insulation degradation
B.26 Insulation tracking
B.27 Life consumption <\/td>\n<\/tr>\n
73<\/td>\nB.28 Low voltage
B.29 Monitoring
B.30 Multiple surge <\/td>\n<\/tr>\n
74<\/td>\nB.31 Noise
B.32 Normal mode
B.33 Partial discharge
B.34 Phase angle <\/td>\n<\/tr>\n
75<\/td>\nB.35 Powered testing <\/td>\n<\/tr>\n
76<\/td>\nB.36 Production test
B.37 Qualification test
B.38 Repetition rate <\/td>\n<\/tr>\n
77<\/td>\nB.39 Surge coupling <\/td>\n<\/tr>\n
78<\/td>\nB.40 Surge event
B.41 Surge let-through <\/td>\n<\/tr>\n
79<\/td>\nB.42 Surge remnant
B.43 Susceptibility
B.44 Test conditions <\/td>\n<\/tr>\n
81<\/td>\nB.45 Unforeseen consequences
B.46 Unpowered testing
B.47 Upset <\/td>\n<\/tr>\n
82<\/td>\nB.48 Vulnerability
B.49 Waveform: Voltage versus current <\/td>\n<\/tr>\n
84<\/td>\nB.50 Withstand level <\/td>\n<\/tr>\n
85<\/td>\nAnnex C (informative) Practical hints on surge testing
C.1 Surge measurements <\/td>\n<\/tr>\n
90<\/td>\nC.2 Point of surge application and measurement
C.3 Trial run on components <\/td>\n<\/tr>\n
91<\/td>\nC.4 Cheesecloth specifications
C.5 Smoke, sights, and sounds
C.6 Does it make sense? <\/td>\n<\/tr>\n
93<\/td>\nAnnex D (informative) Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Recommended Practice on Surge Testing for Equipment Connected to Low-Voltage (1000 V and less) AC Power Circuits<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n2003<\/td>\n94<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":81008,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-81007","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/81007","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/81008"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=81007"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=81007"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=81007"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}