{"id":81007,"date":"2024-10-17T18:50:19","date_gmt":"2024-10-17T18:50:19","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-c62-45-2003\/"},"modified":"2024-10-24T19:45:25","modified_gmt":"2024-10-24T19:45:25","slug":"ieee-c62-45-2003","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-c62-45-2003\/","title":{"rendered":"IEEE C62.45 2003"},"content":{"rendered":"
Revision Standard – Active. The scope of this recommended practice is the performance of surge testing on electrical and electronic equipment connected to low-voltage ac power circuits, specifically using there commended test waveforms defined in IEEE Std C62.41.2TM-2002. Nevertheless, these recommendations are applicable to any surge testing, regardless of the specific surges that may be applied. This IEEE standards product is part C62 Family on Surge Protection.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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1<\/td>\n | IEEE Std C62.45-2002 Cover Page <\/td>\n<\/tr>\n | ||||||
2<\/td>\n | Title Page <\/td>\n<\/tr>\n | ||||||
3<\/td>\n | Abstract\/Keywords <\/td>\n<\/tr>\n | ||||||
5<\/td>\n | Introduction CAUTION Participants <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 1. Overview 1.1 Scope <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 1.2 Purpose <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 2. References <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 3. Definitions 3.1 Technical terms 3.2 Special word usage <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 4. Planning of surge testing: Basic objectives 4.1 General 4.2 Surge environment <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 4.3 Types of tests 4.4 Results and consequences of the test <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 4.5 Unpowered testing versus powered testing <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 4.6 Withstand levels 4.7 Voltage and current waveforms <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 4.8 Safety 5. Implementation of surge testing: Test equipment 5.1 General 5.2 Surge generators <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 5.3 Point of test surge application 5.4 Coupling the surge to the EUT <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 5.5 Monitoring the EUT <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 6. Performance of surge testing: Test procedures 6.1 General 6.2 Limiting stresses 6.3 Nature of the EUT <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 6.4 Safety <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | 7. Applying the test surge: Coupling and decoupling circuits 7.1 General 7.2 Requirements for surge coupling <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | 7.3 Impedance considerations 7.4 Requirements for surge decoupling <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | 7.5 Surge coupling <\/td>\n<\/tr>\n | ||||||
33<\/td>\n | 8. Grounding 8.1 Grounding precautions <\/td>\n<\/tr>\n | ||||||
35<\/td>\n | 8.2 Grounding practices in EUTs 9. Standard surge tests waveforms 9.1 General <\/td>\n<\/tr>\n | ||||||
36<\/td>\n | 9.2 Standard waveforms <\/td>\n<\/tr>\n | ||||||
40<\/td>\n | 9.3 Test procedures <\/td>\n<\/tr>\n | ||||||
41<\/td>\n | 9.4 Equations for standard waveforms <\/td>\n<\/tr>\n | ||||||
43<\/td>\n | 10. Additional surge test waveforms 10.1 General 10.2 Additional waveforms <\/td>\n<\/tr>\n | ||||||
49<\/td>\n | 10.3 Equations for additional waveforms 11. Evaluating test results <\/td>\n<\/tr>\n | ||||||
51<\/td>\n | Annex A (informative) SPD Class I test parameters A.1 General A.2 The IEC Class I test for SPDs A.3 Parameters for a 10\/350 \u00b5s waveform <\/td>\n<\/tr>\n | ||||||
53<\/td>\n | Annex B (informative) Complementary notes B.1 AC power interface (ac power port) <\/td>\n<\/tr>\n | ||||||
54<\/td>\n | B.2 Average power (overstressing) B.3 Back filter B.4 Blind spots <\/td>\n<\/tr>\n | ||||||
55<\/td>\n | B.5 Common mode (and normal mode) <\/td>\n<\/tr>\n | ||||||
57<\/td>\n | B.6 Communications interface (control\/signal port) <\/td>\n<\/tr>\n | ||||||
58<\/td>\n | B.7 Coupler B.8 Coupling gap B.9 Current surging <\/td>\n<\/tr>\n | ||||||
59<\/td>\n | B.10 Current transformers <\/td>\n<\/tr>\n | ||||||
60<\/td>\n | B.11 Damage B.12 Design test <\/td>\n<\/tr>\n | ||||||
61<\/td>\n | B.13 Diagnostic test B.14 Differential connection <\/td>\n<\/tr>\n | ||||||
62<\/td>\n | B.15 Effective output impedance <\/td>\n<\/tr>\n | ||||||
64<\/td>\n | B.16 Environment test versus component specification test <\/td>\n<\/tr>\n | ||||||
65<\/td>\n | B.17 Equipment grounding conductor <\/td>\n<\/tr>\n | ||||||
66<\/td>\n | B.18 Equipment under test (EUT) B.19 Fault current <\/td>\n<\/tr>\n | ||||||
68<\/td>\n | B.20 Follow current B.21 Ground fault protection <\/td>\n<\/tr>\n | ||||||
69<\/td>\n | B.22 Grounding conductor B.23 Grounding practices <\/td>\n<\/tr>\n | ||||||
70<\/td>\n | B.24 Insulation coordination <\/td>\n<\/tr>\n | ||||||
72<\/td>\n | B.25 Insulation degradation B.26 Insulation tracking B.27 Life consumption <\/td>\n<\/tr>\n | ||||||
73<\/td>\n | B.28 Low voltage B.29 Monitoring B.30 Multiple surge <\/td>\n<\/tr>\n | ||||||
74<\/td>\n | B.31 Noise B.32 Normal mode B.33 Partial discharge B.34 Phase angle <\/td>\n<\/tr>\n | ||||||
75<\/td>\n | B.35 Powered testing <\/td>\n<\/tr>\n | ||||||
76<\/td>\n | B.36 Production test B.37 Qualification test B.38 Repetition rate <\/td>\n<\/tr>\n | ||||||
77<\/td>\n | B.39 Surge coupling <\/td>\n<\/tr>\n | ||||||
78<\/td>\n | B.40 Surge event B.41 Surge let-through <\/td>\n<\/tr>\n | ||||||
79<\/td>\n | B.42 Surge remnant B.43 Susceptibility B.44 Test conditions <\/td>\n<\/tr>\n | ||||||
81<\/td>\n | B.45 Unforeseen consequences B.46 Unpowered testing B.47 Upset <\/td>\n<\/tr>\n | ||||||
82<\/td>\n | B.48 Vulnerability B.49 Waveform: Voltage versus current <\/td>\n<\/tr>\n | ||||||
84<\/td>\n | B.50 Withstand level <\/td>\n<\/tr>\n | ||||||
85<\/td>\n | Annex C (informative) Practical hints on surge testing C.1 Surge measurements <\/td>\n<\/tr>\n | ||||||
90<\/td>\n | C.2 Point of surge application and measurement C.3 Trial run on components <\/td>\n<\/tr>\n | ||||||
91<\/td>\n | C.4 Cheesecloth specifications C.5 Smoke, sights, and sounds C.6 Does it make sense? <\/td>\n<\/tr>\n | ||||||
93<\/td>\n | Annex D (informative) Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Recommended Practice on Surge Testing for Equipment Connected to Low-Voltage (1000 V and less) AC Power Circuits<\/b><\/p>\n |