DIN 50989-3:2022 Edition

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Ellipsometry – Part 3: Transparent single layer model

Published By	Publication Date	Number of Pages
DIN	2022-04	77

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Categories: 19.100 - Non-destructive testing, DIN

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Description

This document uses ellipsometric measurements and their analysis to specify the method for the determination of the layer thickness d of a transparent layer and the optical (refractive index n) or dielectric (real part ε<(index)1>) constants/functions based on the transparent single layer model within a spectral region, for which k = 0 applies.

Additional information

Published Code	DIN
Published By	Deutsches Institut für Normung
Publication Date	2022-04
Pages Count	77
Language	Germany
Descriptors	Coating thickness, Constant, Definitions, Determination, Dielectric, Dielectric constant, Ellipsometry, Interpretations, Layers, Materials, Materials testing, Measurement, Measuring techniques, Metal coatings, Optical, Refractive index, Surface properties, Surfaces, Transparencies
File Size	3.7 MB
ICS Codes	19.100 - Non-destructive testing

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DIN 50989-3:2022 Edition

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