{"id":242087,"date":"2024-10-19T15:51:51","date_gmt":"2024-10-19T15:51:51","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iec-61000-4-362014\/"},"modified":"2024-10-25T10:43:13","modified_gmt":"2024-10-25T10:43:13","slug":"bs-iec-61000-4-362014","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iec-61000-4-362014\/","title":{"rendered":"BS IEC 61000-4-36:2014"},"content":{"rendered":"

This part of IEC 61000<\/span> <\/span> provides methods to determine test levels for the assessment of the immunity of equipment and systems to intentional electromagnetic interference (IEMI) sources. It introduces the general IEMI problem, IEMI source parameters, derivation of test limits and summarises practical test methods.<\/p>\n

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PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
4<\/td>\nCONTENTS <\/td>\n<\/tr>\n
8<\/td>\nFOREWORD <\/td>\n<\/tr>\n
10<\/td>\nINTRODUCTION <\/td>\n<\/tr>\n
11<\/td>\n1 Scope
2 Normative references
3 Terms, definitions and abbreviations
3.1 Terms and defintions <\/td>\n<\/tr>\n
14<\/td>\n3.2 Abbreviations <\/td>\n<\/tr>\n
15<\/td>\n4 General
5 IEMI environments and interaction
5.1 General <\/td>\n<\/tr>\n
16<\/td>\n5.2 IEMI environments
5.2.1 Technical capability groups
5.2.2 IEMI deployment scenarios <\/td>\n<\/tr>\n
17<\/td>\n5.2.3 Radiated IEMI environment summary
5.2.4 Published conducted IEMI environments
Tables
Table 1 \u2013 Possible IEMI Deployment Scenarios
Table 2 \u2013 Summary of radiated IEMI source output (rEfar) by capability group <\/td>\n<\/tr>\n
18<\/td>\n5.3 Interaction with fixed installations
5.3.1 General
Figures
Figure 1 \u2013 Example of radiated and conducted IEMI interaction with a building <\/td>\n<\/tr>\n
19<\/td>\n5.3.2 Protection level
6 Test methods
6.1 Derivation of applicable test methods
Table 3 \u2013 Example protection levels <\/td>\n<\/tr>\n
20<\/td>\n6.2 Derivation of transfer functions
Figure 2 \u2013 Assessment options <\/td>\n<\/tr>\n
21<\/td>\n6.3 Radiated tests using IEMI simulator
6.4 Radiated tests using a reverberation chamber
6.5 Complex waveform injection (CWI)
6.6 Damped sinusoidal injection (DSI)
6.7 Electrostatic discharge (ESD)
6.8 Electrically fast transient (EFT) <\/td>\n<\/tr>\n
22<\/td>\n6.9 Antenna port injection
7 Test parameters
7.1 Derivation of immunity test parameters
Figure 3 \u2013 Examples of ports <\/td>\n<\/tr>\n
23<\/td>\n7.2 Radiated test parameters
7.2.1 Generic hyperband test parameters (skilled capability group)
7.2.2 Generic mesoband test parameters (skilled capability group)
Figure 4 \u2013 Typical hyperband waveform
Table 4 \u2013 Generic hyperband test parameters (skilled capability group) <\/td>\n<\/tr>\n
24<\/td>\nTable 5 \u2013 Generic mesoband test parameters (skilled capability group) <\/td>\n<\/tr>\n
25<\/td>\n7.2.3 Generic hypoband\/narrowband test parameters (skilled capability group)
Figure 5 \u2013 Typical mesoband waveform
Table 6 \u2013 Generic hypoband\/narrowband test parameters (skilled capability group) <\/td>\n<\/tr>\n
26<\/td>\n7.3 Generic conducted IEMI test parameters
7.3.1 General
Figure 6 \u2013 Typical hypoband\/narrowband waveform
Table 7 \u2013 Conducted IEMI test levels <\/td>\n<\/tr>\n
27<\/td>\n7.3.2 Characteristics and performance of the fast damped oscillatory wave generator
Figure 7 \u2013 Waveform of the damped oscillatory wave (open circuit voltage)
Table 8 \u2013 Open circuit specifications <\/td>\n<\/tr>\n
28<\/td>\n7.4 Tailored test level derivation
7.5 Relevance of EMC immunity data
Table 9 \u2013 Short Circuit Specifications <\/td>\n<\/tr>\n
29<\/td>\n8 Bibliography <\/td>\n<\/tr>\n
31<\/td>\nAnnex A (informative) Failure mechanisms and performance criteria
A.1 General
A.2 Failure mechanisms
A.2.1 General <\/td>\n<\/tr>\n
32<\/td>\nA.2.2 Noise
A.2.3 Parameter offset and drifts
Figure A.1 \u2013 IEMI induced offset of sensor output \u2013 Corruption of information <\/td>\n<\/tr>\n
33<\/td>\nA.2.4 System upset or breakdown
A.2.5 Component destruction
Figure A.2 \u2013 Collision of an induced disturbance with data bits [1]
Figure A.3 \u2013 Examples of destruction on a chip [2] <\/td>\n<\/tr>\n
34<\/td>\nA.3 Effect of pulse width
A.4 Performance criteria
Figure A.4 \u2013 Generic failure trend as a function of pulse width <\/td>\n<\/tr>\n
35<\/td>\nA.5 References
Table A.1 \u2013 Recommended performance criteria <\/td>\n<\/tr>\n
37<\/td>\nAnnex B (informative) Developments in IEMI source environments
B.1 General
Figure B.1 \u2013 A comparison of HPEM and IEMI spectra [6] <\/td>\n<\/tr>\n
38<\/td>\nB.2 IEMI environment <\/td>\n<\/tr>\n
39<\/td>\nB.3 IEMI sources
Figure B.2 \u2013 Representation of typical IEMI radiation and coupling onto systems [3] <\/td>\n<\/tr>\n
40<\/td>\nFigure B.3 \u2013 Parameter space in power\/frequency occupied by sophisticated IEMI (i.e. DEW) sources [1]
Figure B.4 \u2013 Peak power and energy from continuous and pulsed (durations shown) microwave sources, narrowband and wideband <\/td>\n<\/tr>\n
41<\/td>\nFigure B.5 \u2013 Peak powers of various types of pulsed HPM sources [1]
Figure B.6 \u2013 Peak vs. average power for microwave sources with duty factors indicated <\/td>\n<\/tr>\n
42<\/td>\nFigure B.7 \u2013 Phase coherence leading to a compact HPM source with N2 scaling of output power
Figure B.8 \u2013 Briefcase mesoband UWB source sold by Diehl-Rheinmetall [3] <\/td>\n<\/tr>\n
43<\/td>\nB.4 Published radiated IEMI environments
B.4.1 IEC 61000-2-13
B.4.2 Mil-Std-464C
Figure B.9 \u2013 A do-it-yourself electromagnetic weapon made from an oven magnetron [13]
Table B.1 \u2013 IEMI environments from IEC\u00a061000-2-13 <\/td>\n<\/tr>\n
44<\/td>\nB.4.3 The International Telecommunication Union (ITU)
B.4.4 Practical determination of a tailored test level \u2013 An example
Table B.2 \u2013 Hypoband\/narrowband HPM environment
Table B.3 \u2013 Hyperband\/wideband HPM environment <\/td>\n<\/tr>\n
45<\/td>\nB.5 Summary
Figure B.10 \u2013 Plot of entire narrowband system weight as a function of output microwave power for land-mobile and land-transportable systems <\/td>\n<\/tr>\n
46<\/td>\nB.6 References <\/td>\n<\/tr>\n
48<\/td>\nAnnex C (informative) Interaction with buildings
C.1 Building attenuation
Figure C.1 \u2013 Typical unprotected low-rise building plane wave E-field attenuation collected from references <\/td>\n<\/tr>\n
49<\/td>\nC.2 Coupling to cables
Table C.1 \u2013 Shielding effectiveness measurements for various power system buildings and rooms <\/td>\n<\/tr>\n
50<\/td>\nC.3 Low voltage cable attenuation
Figure C.2 \u2013 Cable coupling \u2013 Resonance region <\/td>\n<\/tr>\n
51<\/td>\nC.4 References
Figure C.3 \u2013 Mains cable attenuation profile <\/td>\n<\/tr>\n
53<\/td>\nAnnex D (informative) Relation between plane wave immunity testing and immunity testing in a reverberation chamber
D.1 General <\/td>\n<\/tr>\n
54<\/td>\nD.2 Relation between measurements of shielding effectiveness in the two environments <\/td>\n<\/tr>\n
57<\/td>\nD.3 Relation between immunity testing in the two environments <\/td>\n<\/tr>\n
59<\/td>\nD.4 Additional aspects
D.5 References <\/td>\n<\/tr>\n
62<\/td>\nAnnex E (informative) Complex waveform injection \u2013 Test method
E.1 General
E.2 Prediction
E.2.1 General <\/td>\n<\/tr>\n
63<\/td>\nFigure E.1 \u2013 LLSC reference field measurement set-up <\/td>\n<\/tr>\n
64<\/td>\nFigure E.2 \u2013 LLSC induced current measurement set-up
Figure E.3 \u2013 Typical LLSC magnitude-only transfer function <\/td>\n<\/tr>\n
65<\/td>\nFigure E.4 \u2013 Prediction of induced current using minimum phase constraints <\/td>\n<\/tr>\n
66<\/td>\nE.2.2 Example
Figure E.5 \u2013 IEC\u00a061000-2-9 early-time (E1) HEMP environment <\/td>\n<\/tr>\n
67<\/td>\nFigure E.6 \u2013 Overlay of transfer function and threat (frequency domain)
Figure E.7 \u2013 Predicted current <\/td>\n<\/tr>\n
68<\/td>\nE.3 Construction
Table E.1 \u2013 Time waveform norms <\/td>\n<\/tr>\n
69<\/td>\nFigure E.8 \u2013 Example of de-convolution result
Figure E.9 \u2013 Damped sinusoidal waveforms \u2013 Ten-component fit <\/td>\n<\/tr>\n
70<\/td>\nFigure E.10 \u2013 Approximated and predicted transient
Figure E.11 \u2013 Approximated and predicted transient (0 ns to 100 ns) <\/td>\n<\/tr>\n
71<\/td>\nFigure E.12 \u2013 Approximation and prediction transient \u2013 Frequency domain comparison <\/td>\n<\/tr>\n
72<\/td>\nE.4 Injection
Figure E.13 \u2013 Variation in error for increasing number of damped sinusoids <\/td>\n<\/tr>\n
73<\/td>\nFigure E.14 \u2013 Complex injection set-up
Figure E.15 \u2013 Amplifier requirements for various current levels <\/td>\n<\/tr>\n
74<\/td>\nE.5 Summary
E.6 References
Figure E.16 \u2013 Comparison of predicted (green) and injected (red) current <\/td>\n<\/tr>\n
76<\/td>\nAnnex F (informative) Significance of test methodology margins
F.1 General
F.2 Examples
F.2.1 General <\/td>\n<\/tr>\n
77<\/td>\nF.2.2 Negative contributions
Figure F.1 \u2013 Variation in induced currents as a result of configuration <\/td>\n<\/tr>\n
78<\/td>\nFigure F.2 \u2013 Comparison of HPD and VPD induced currents
Figure F.3 \u2013 System variability <\/td>\n<\/tr>\n
79<\/td>\nF.2.3 Positive contributions
Figure F.4 \u2013 Comparison of single- and multi-port injection <\/td>\n<\/tr>\n
80<\/td>\nFigure F.5 \u2013 Example transfer functions and worst-case envelope
Figure F.6 \u2013 Comparison of individual and worst-case transfer function predictions <\/td>\n<\/tr>\n
81<\/td>\nF.2.4 Summary
F.3 References
Figure F.7 \u2013 Comparison between predicted and measured induced currents <\/td>\n<\/tr>\n
82<\/td>\nAnnex G (informative) Intentional EMI \u2013 The issue of jammers
G.1 General
G.2 Effects <\/td>\n<\/tr>\n
83<\/td>\nG.3 Published accounts of jamming
G.4 Risk assessment
G.5 Mitigation <\/td>\n<\/tr>\n
84<\/td>\nG.6 References <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Electromagnetic compatibility (EMC) – Testing and measurement techniques. IEMI immunity test methods for equipment and systems<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2014<\/td>\n88<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":242091,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[626,2641],"product_tag":[],"class_list":{"0":"post-242087","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-33-100-20","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/242087","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/242091"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=242087"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=242087"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=242087"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}