{"id":396972,"date":"2024-10-20T04:27:37","date_gmt":"2024-10-20T04:27:37","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-c62-32-2004\/"},"modified":"2024-10-26T08:15:05","modified_gmt":"2024-10-26T08:15:05","slug":"ieee-c62-32-2004","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-c62-32-2004\/","title":{"rendered":"IEEE C62.32-2004"},"content":{"rendered":"
Revision Standard – Inactive-Withdrawn. This standard applies to air gaps for overvoltage protection applications on systems with operating voltages equal to or less than 600 V rms. This standard contains a series of standard tests for determining the electrical characteristics of these air gap devices. This standard\u2019s test criteria and definitions provide a common engineering language beneficial to users and manufacturers of air gap surge protective devices.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
1<\/td>\n | IEEE Standard Test Methods for Low-Voltage Air Gap Surge-Protective Device Components (Excluding Valve and Expulsion Types) <\/td>\n<\/tr>\n | ||||||
3<\/td>\n | Title page <\/td>\n<\/tr>\n | ||||||
5<\/td>\n | Introduction Notice to users Patents Interpretations Patents <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | Participants <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 1. Scope <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 2. Definitions <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 3. Service conditions 3.1 Normal service conditions 3.1.1 Physical conditions 3.1.2 System conditions 3.2 Unusual service conditions 3.2.1 Physical conditions 3.2.2 System conditions <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 4. Standard design test criteria 4.1 General 4.2 Ambient conditions 4.3 Necessary precautions for testing air gaps 4.4 Current waveform decay time <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 4.5 Insulation resistance measurement and clearing source 4.6 DC breakdown voltage test <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 4.7 Capacitance test 4.8 Insulation resistance test <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 4.9 Initial impulse breakdown voltage test <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 4.10 Impulse breakdown voltage variability test <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 4.11 Maximum single impulse discharge current test 4.12 Impulse life test <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 4.13 AC discharge current test 4.14 Pulsed AC test <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 4.14.1 Pulsed AC life tests 4.14.2 Pulsed AC gap erosion test 4.15 Alternating follow-on current test <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 4.16 DC holdover test <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 4.17 Failure mode 4.17.1 Short-circuit failure mode 4.17.2 Low breakdown voltage failure mode 4.17.3 High breakdown voltage failure mode <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 4.17.4 Low insulation resistance failure mode 4.18 Fail-safe operation <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | Annex A\u2014(informative) Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Standard Test Methods for Low-Voltage Air Gap Surge-Protective Device Components (Excluding Valve and Expulsion Types)<\/b><\/p>\n |