{"id":291212,"date":"2024-10-19T19:46:17","date_gmt":"2024-10-19T19:46:17","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-224892016\/"},"modified":"2024-10-25T16:47:54","modified_gmt":"2024-10-25T16:47:54","slug":"bs-iso-224892016","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-224892016\/","title":{"rendered":"BS ISO 22489:2016"},"content":{"rendered":"

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
6<\/td>\nForeword <\/td>\n<\/tr>\n
7<\/td>\nIntroduction <\/td>\n<\/tr>\n
9<\/td>\n1 Scope
2 Normative references
3 Abbreviated terms <\/td>\n<\/tr>\n
10<\/td>\n4 Procedure for quantification
4.1 General procedure for quantitative microanalysis
4.1.1 Principle and procedure of quantitative microanalysis
4.1.2 Coverage of the quantitative analysis <\/td>\n<\/tr>\n
11<\/td>\n4.1.3 Selection of reference materials
4.2 Specimen preparation
4.3 Calibration of the instrument
4.3.1 Accelerating voltage
4.3.2 Probe current
4.3.3 X-ray spectrometer <\/td>\n<\/tr>\n
12<\/td>\n4.3.4 Dead time
4.4 Analysis conditions
4.4.1 Accelerating voltage
4.4.2 Probe current
4.4.3 Analysis position <\/td>\n<\/tr>\n
13<\/td>\n4.4.4 Probe diameter
4.4.5 Scanning the focused electron beam
4.4.6 Specimen surface
4.4.7 Selection of X-ray line
4.4.8 Spectrometer <\/td>\n<\/tr>\n
14<\/td>\n4.4.9 Method for measurement of X-ray peak intensity
4.4.10 Method for measurement of background intensity
4.5 Correction method based on analytical models
4.5.1 Principles <\/td>\n<\/tr>\n
15<\/td>\n4.5.2 Correction models
4.6 Calibration curve method
4.6.1 Principle <\/td>\n<\/tr>\n
16<\/td>\n4.6.2 Selection of reference materials
4.6.3 Procedure
4.7 Uncertainty
5 Test report <\/td>\n<\/tr>\n
18<\/td>\nAnnex\u00a0A (informative) Physical effects and correction <\/td>\n<\/tr>\n
20<\/td>\nAnnex\u00a0B (informative) Outline of various correction techniques <\/td>\n<\/tr>\n
22<\/td>\nAnnex\u00a0C (informative) Measurement of the k-ratios in case of \u201cchemical effects\u201d <\/td>\n<\/tr>\n
23<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2016<\/td>\n26<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":291217,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[1002,2641],"product_tag":[],"class_list":{"0":"post-291212","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-71-040-99","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/291212","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/291217"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=291212"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=291212"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=291212"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}