{"id":340724,"date":"2024-10-19T23:52:33","date_gmt":"2024-10-19T23:52:33","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-pd-iso-tr-167432013\/"},"modified":"2024-10-25T23:03:05","modified_gmt":"2024-10-25T23:03:05","slug":"bsi-pd-iso-tr-167432013","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-pd-iso-tr-167432013\/","title":{"rendered":"BSI PD ISO\/TR 16743:2013"},"content":{"rendered":"

This Technical Report gives terms and definitions and describes techniques for the characterization of wavefronts influenced by optical systems and optical components. It describes basic configurations for a variety of wavefront sensing systems and discusses the usefulness of tests in different situations.<\/p>\n

The aim is to cover practical instruments and techniques for measuring the wavefronts produced by optical systems and optical components. This Technical Report includes various implementations of the Hartmann method, the curvature sensor and applications of the knife-edge method. The use of interferometers is discussed. This Technical Report also includes techniques such as phase diversity and pyramid sensors, currently used in astronomy and being developed for other areas.<\/p>\n

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NOTE More information on interferometry can be found in ISO\/TR 14999-1, ISO\/TR 14999\u22122 and ISO\/TR 14999\u22123.<\/p>\n<\/blockquote>\n

This Technical Report explains briefly how these techniques work and includes diagrams illustrating the use of this type of equipment for making the measurements required for ISO 10110-5, ISO 10110-8, ISO 10110-12 (slope requirements) and ISO 10110-14.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
6<\/td>\nForeword <\/td>\n<\/tr>\n
7<\/td>\nSection sec_1
Section sec_2
1\tScope
2\tIntroduction to wavefront sensing techniques <\/td>\n<\/tr>\n
8<\/td>\nSection sec_3
Section sec_3.1
Table tab_a
Figure fig_1
3\tFoucault knife-edge test
3.1\tThe knife-edge test <\/td>\n<\/tr>\n
9<\/td>\nSection sec_3.2
Section sec_3.3
Section sec_3.4
3.2\tVariations on the knife-edge test
3.3\tApplication of knife-edge test to diode lasers
3.4\tThe pyramid sensor <\/td>\n<\/tr>\n
10<\/td>\nTable tab_b
Figure fig_2
Section sec_4
Section sec_4.1
Section sec_4.2
4\tScreen testing
4.1\tGeneral
4.2\tHartmann test <\/td>\n<\/tr>\n
11<\/td>\nSection sec_4.3
4.3\tThe development of automated wavefront sensing <\/td>\n<\/tr>\n
12<\/td>\nSection sec_4.4
Table tab_c
Figure fig_3
Table tab_d
Figure fig_4
4.4\tShack-Hartmann test <\/td>\n<\/tr>\n
13<\/td>\nSection sec_4.5
Section sec_4.5.1
Section sec_4.5.2
Section sec_4.5.3
4.5\tMeasurements with a Shack-Hartmann sensor <\/td>\n<\/tr>\n
14<\/td>\nSection sec_4.5.4
Section sec_4.5.5
Section sec_4.5.5.1
Section sec_4.5.5.2
Section sec_5
Section sec_5.1
Figure fig_5
Section sec_5.2
5\tWavefront curvature sensors
5.1\tGeneral
5.2\tWavefront curvature sensing and phase diversity techniques <\/td>\n<\/tr>\n
15<\/td>\nTable tab_e
Figure fig_6
Section sec_5.3
5.3\tPhase diversity wavefront sensor with diffraction grating <\/td>\n<\/tr>\n
16<\/td>\nTable tab_f
Figure fig_7
Section sec_6
Section sec_6.1
6\tWavefront sensing by interferometry
6.1\tGeneral <\/td>\n<\/tr>\n
17<\/td>\nSection sec_6.2
6.2\tSelf-referencing interferometry <\/td>\n<\/tr>\n
18<\/td>\nSection sec_6.3
Section sec_6.4
Section sec_6.4.1
6.3\tElectronic detection and phase measurement
6.4\tShearing interferometry <\/td>\n<\/tr>\n
19<\/td>\nSection sec_6.4.2 <\/td>\n<\/tr>\n
20<\/td>\nSection sec_6.4.3 <\/td>\n<\/tr>\n
21<\/td>\nTable tab_g
Figure fig_8
Section sec_6.4.4
Table tab_h
Figure fig_9 <\/td>\n<\/tr>\n
22<\/td>\nSection sec_6.4.5
Section sec_6.4.5.1
Section sec_6.4.5.2 <\/td>\n<\/tr>\n
23<\/td>\nTable tab_i
Figure fig_10
Section sec_6.5
Section sec_6.5.1
Section sec_6.5.2
6.5\tPoint-diffraction interferometers with error-free reference wavefronts <\/td>\n<\/tr>\n
24<\/td>\nTable tab_j
Figure fig_11
Section sec_6.5.3 <\/td>\n<\/tr>\n
25<\/td>\nTable tab_k
Figure fig_12 <\/td>\n<\/tr>\n
26<\/td>\nTable tab_l
Figure fig_13
Section sec_6.6
6.6\tLateral shearing and the Ronchi test <\/td>\n<\/tr>\n
27<\/td>\nSection sec_6.7
Table tab_m
Figure fig_14
6.7\tLateral shearing with a double frequency grating <\/td>\n<\/tr>\n
28<\/td>\nSection sec_7
Table tab_1
7\tSummary of wavefront sensing methods <\/td>\n<\/tr>\n
29<\/td>\nTable tab_2 <\/td>\n<\/tr>\n
30<\/td>\nTable tab_3 <\/td>\n<\/tr>\n
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Bibliography <\/td>\n<\/tr>\n
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Reference ref_67 <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Optics and photonics. Wavefront sensors for characterising optical systems and optical components<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2013<\/td>\n36<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":340731,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2641],"product_tag":[],"class_list":{"0":"post-340724","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-bsi","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/340724","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/340731"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=340724"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=340724"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=340724"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}