{"id":436887,"date":"2024-10-20T07:56:32","date_gmt":"2024-10-20T07:56:32","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-2671-2022-3\/"},"modified":"2024-10-26T14:58:16","modified_gmt":"2024-10-26T14:58:16","slug":"ieee-2671-2022-3","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-2671-2022-3\/","title":{"rendered":"IEEE 2671-2022"},"content":{"rendered":"
New IEEE Standard – Active. General requirements of online detection based on machine vision, including requirements for data format, data transmission processes, definition of application scenarios and performance metrics for evaluating the effect of online detection deployment are specified in this standard.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
1<\/td>\n | IEEE Std 2671-2022 Front cover <\/td>\n<\/tr>\n | ||||||
2<\/td>\n | Title page <\/td>\n<\/tr>\n | ||||||
4<\/td>\n | Important Notices and Disclaimers Concerning IEEE Standards Documents <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | Participants <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | Contents <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | List of Figures <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | List of Tables <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 1.\u2002Overview 1.1\u2002Scope 1.2\u2002Purpose 1.3\u2002Word usage <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 2.\u2002Normative references 3.\u2002Definitions, acronyms, and abbreviations 3.1\u2002Definitions 3.2\u2002Acronyms and abbreviations <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 4.\u2002Generic flows and architecture 4.1\u2002Generic flows and generic architecture <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 4.2\u2002Scenario and defect modes 5.\u2002Input 5.1\u2002Requirements for image acquisition <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 5.2\u2002Setup <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 5.3\u2002Lighting 5.4\u2002Camera 5.5\u2002Other features <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 6.\u2002Process 6.1\u2002Requirements of vision-based processing <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 6.2\u2002Features 7.\u2002Output 7.1\u2002Output requirements <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 7.2\u2002Output data, output file, and output form 7.3\u2002System interface standards 7.4\u2002Output storage methods 8.\u2002Function requirements 8.1\u2002General <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | 8.2\u2002Operation mode switching function <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | 8.3\u2002Configuration management function 8.4\u2002Self-diagnostic function 8.5\u2002Remote system maintenance function 8.6\u2002Report function 8.7\u2002Control function <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | 8.8\u2002Security and safety function 8.9\u2002System reset function 9.\u2002Interoperability Requirements 9.1\u2002Scenario <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | 9.2\u2002Interoperability requirement 9.3\u2002Communication protocol <\/td>\n<\/tr>\n | ||||||
30<\/td>\n | 9.4\u2002Communication interface 9.5\u2002Data access 9.6\u2002System management function <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | 10.\u2002Performance 10.1\u2002Comprehensive performance <\/td>\n<\/tr>\n | ||||||
33<\/td>\n | 10.2\u2002 Equipment performance 10.3\u2002 Process performance <\/td>\n<\/tr>\n | ||||||
34<\/td>\n | 10.4\u2002Manufacturing management performance 11.\u2002Test methodology 11.1\u2002General <\/td>\n<\/tr>\n | ||||||
35<\/td>\n | 11.2\u2002Industrial scene survey 11.3\u2002Demand to sort out 11.4\u2002Testing preparation 11.5\u2002Select the test case 11.6\u2002Select industry comparison samples 11.7\u2002Test suite simulation <\/td>\n<\/tr>\n | ||||||
36<\/td>\n | 11.8\u2002Output test results <\/td>\n<\/tr>\n | ||||||
37<\/td>\n | Annex\u00a0A (informative) Integrated circuit (IC) substrate inspection A.1\u2002Overview <\/td>\n<\/tr>\n | ||||||
38<\/td>\n | A.2\u2002Detailed introduction <\/td>\n<\/tr>\n | ||||||
42<\/td>\n | A.3\u2002Analysis <\/td>\n<\/tr>\n | ||||||
43<\/td>\n | Annex\u00a0B (normative) Thermal grease online detection B.1\u2002Overview <\/td>\n<\/tr>\n | ||||||
44<\/td>\n | B.2\u2002Detailed introduction <\/td>\n<\/tr>\n | ||||||
47<\/td>\n | B.3\u2002Analysis <\/td>\n<\/tr>\n | ||||||
48<\/td>\n | Annex C (informative) Machine vision in process control of IC manufacturing C.1\u2002Overview <\/td>\n<\/tr>\n | ||||||
49<\/td>\n | C.2\u2002Detailed introduction <\/td>\n<\/tr>\n | ||||||
52<\/td>\n | C.3\u2002Analysis <\/td>\n<\/tr>\n | ||||||
53<\/td>\n | Annex\u00a0D (informative) Online detection on semiconductor package D.1\u2002Overview <\/td>\n<\/tr>\n | ||||||
54<\/td>\n | D.2\u2002Detailed introduction <\/td>\n<\/tr>\n | ||||||
59<\/td>\n | D.3\u2002Analysis <\/td>\n<\/tr>\n | ||||||
60<\/td>\n | Annex\u00a0E (informative) Defect detection of magnetic tiles based on machine vision E.1\u2002Overview <\/td>\n<\/tr>\n | ||||||
62<\/td>\n | E.2\u2002Detailed introduction <\/td>\n<\/tr>\n | ||||||
64<\/td>\n | E.3\u2002Analysis <\/td>\n<\/tr>\n | ||||||
65<\/td>\n | Back cover <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Standard for General Requirements of Online Detection Based on Machine Vision in Intelligent Manufacturing (Published)<\/b><\/p>\n |