{"id":579414,"date":"2024-11-05T20:12:46","date_gmt":"2024-11-05T20:12:46","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/iec-ts-62607-6-102021\/"},"modified":"2024-11-05T20:12:46","modified_gmt":"2024-11-05T20:12:46","slug":"iec-ts-62607-6-102021","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/iec\/iec-ts-62607-6-102021\/","title":{"rendered":"IEC TS 62607-6-10:2021"},"content":{"rendered":"<p>IEC TS 62607-6-10:2021(E) establishes a standardized method to determine the electrical key control characteristic<br \/>\n\u2013 sheet resistance (Rs)<br \/>\nfor films of graphene-based materials by<br \/>\n\u2013 terahertz time domain spectroscopy (THz-TDS).<br \/>\nIn this technique, a THz pulse is sent to the graphene-based material. The transmitted or reflected THz waveform is measured in the time domain and transformed to the frequency domain by the fast Fourier transform (FFT). Finally, the spectrum is fitted to the Drude model (or another comparable model) to obtain the sheet resistance.<br \/>\n\u2022 This non-contact inspection method is non-destructive, fast and robust for the mapping of large areas of graphene films, with no upper sample size limit.<br \/>\n\u2022 The method is applicable for statistical process control, comparison of graphene films produced by different vendors, or to obtain information about imperfections on the microscale such as grain boundaries and defects, etc.<br \/>\n\u2022 The method is applicable for graphene grown by chemical vapour deposition (CVD) or other methods on or transferred to dielectric substrates, including but not limited to quartz, silica (SiO2), silicon (Si), sapphire, silicon carbide (SiC) and polymers.<br \/>\n\u2022 The minimum spatial resolution is in the order of 300 \u00b5m (at 1 THz) given by the diffraction limited spot size of the THz pulse.<\/p>\n","protected":false},"excerpt":{"rendered":"<p><b>Nanomanufacturing &#8211; Key control characteristics &#8211; Part 6-10: Graphene-based material &#8211; Sheet resistance: Terahertz time-domain spectroscopy<\/b><\/p>\n<table style=\"width: 100%\" border=\"0\" cellspacing=\"0\" cellpadding=\"0\">\n<tbody>\n<tr>\n<td>Published By<\/td>\n<td>Publication Date<\/td>\n<td>Number of Pages<\/td>\n<\/tr>\n<tr>\n<td><a href=\"https:\/\/pdfstandards.shop\/product-category\/publishers\/iec\/\"><b>IEC<\/b><\/a><\/td>\n<td>2021-10-14<\/td>\n<td>48<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":579430,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[127,2636],"product_tag":[],"class_list":{"0":"post-579414","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-07-120","7":"product_cat-iec","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/579414","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/579430"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=579414"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=579414"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=579414"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}